Imaging Beam-Sensitive Materials by Electron Microscopy.

Embargo End Date
2021-03-01

Type
Article

Authors
Chen, Qiaoli
Dwyer, Christian
Sheng, Guan
Zhu, Chongzhi
Li, Xiaonian
Zheng, Changlin
Zhu, Yihan

KAUST Department
Chemical Engineering
Chemical Engineering Program
Physical Science and Engineering (PSE) Division

Online Publication Date
2020-02-28

Print Publication Date
2020-04

Date
2020-02-28

Submitted Date
2019-11-20

Abstract
Electron microscopy allows the extraction of multidimensional spatiotemporally correlated structural information of diverse materials down to atomic resolution, which is essential for figuring out their structure-property relationships. Unfortunately, the high-energy electrons that carry this important information can cause damage by modulating the structures of the materials. This has become a significant problem concerning the recent boost in materials science applications of a wide range of beam-sensitive materials, including metal-organic frameworks, covalent-organic frameworks, organic-inorganic hybrid materials, 2D materials, and zeolites. To this end, developing electron microscopy techniques that minimize the electron beam damage for the extraction of intrinsic structural information turns out to be a compelling but challenging need. This article provides a comprehensive review on the revolutionary strategies toward the electron microscopic imaging of beam-sensitive materials and associated materials science discoveries, based on the principles of electron-matter interaction and mechanisms of electron beam damage. Finally, perspectives and future trends in this field are put forward.

Citation
Chen, Q., Dwyer, C., Sheng, G., Zhu, C., Li, X., Zheng, C., & Zhu, Y. (2020). Imaging Beam-Sensitive Materials by Electron Microscopy. Advanced Materials, 1907619. doi:10.1002/adma.201907619

Acknowledgements
Y.Z. acknowledges the financial support from the National Natural Science Foundation of China (Grant Nos. 21771161 and 51701181), the Zhejiang Provincial Natural Science Foundation of China (Grant No. LR18B030003), and Thousand Talents Program for Distinguished Young Scholars. C.Z. acknowledges the financial support from the National Natural Science Foundation of China (Grant No. 61871134), Shanghai Municipal Science and Technology Commission (Grant No. 18JC1410300), and Fudan University Scientific Research Foundation (IDH1512043). C.D. acknowledges the financial support from the National Science Foundation (Grant Nos. 1936882 and DMR-1920335) and is grateful for Fudan University Key Laboratory Visiting Fellowship (Grant No. GF2019_05). The authors thank Y. Yao from Beijing National Laboratory for Condensed Matter Physics for useful discussions.

Publisher
Wiley

Journal
Advanced Materials

DOI
10.1002/adma.201907619

Additional Links
https://onlinelibrary.wiley.com/doi/abs/10.1002/adma.201907619

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