Metrology System Based on Metasurface Implementation of Artificial Inteligence
Type
PresentationKAUST Department
King Abdullah University of Science and Technology,PRIMALIGHT, Faculty of Electrical Engineering; Applied Mathematics and Computational Science,Thuwal,Saudi Arabia,23955-6900Electrical and Computer Engineering Program
Computer, Electrical and Mathematical Science and Engineering (CEMSE) Division
Applied Mathematics and Computational Science Program
Date
2023-06-26Permanent link to this record
http://hdl.handle.net/10754/694223
Metadata
Show full item recordAbstract
Optical instrumentation is ubiquitous across scientific disciplines and industrial settings for its ability to deliver non-destructive and high accuracy mesurements [1]. However, as global manufacturing transitions an automated industry paradigm, the need for highly integrated metrology systems for autonomous machines cannot be addressed traditional bulk optics based equipment [2]. Metasurfaces provide a possible solution to this challenge, enabling near-arbitrary light control functionality in a compact form factor [3]–[5].Citation
Burguete-Lopez, A., Makarenko, M., Wang, Q., Getman, F., & Fratalocchi, A. (2023). Metrology System Based on Metasurface Implementation of Artificial Inteligence. 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC). https://doi.org/10.1109/cleo/europe-eqec57999.2023.10231970Publisher
IEEEConference/Event name
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)Additional Links
https://ieeexplore.ieee.org/document/10231970/ae974a485f413a2113503eed53cd6c53
10.1109/cleo/europe-eqec57999.2023.10231970