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    Combined HW/SW Drift and Variability Mitigation for PCM-based Analog In-memory Computing for Neural Network Applications

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    Combined_HW_SW_Drift_and_Variability_Mitigation_for_PCM-based_Analog_In-memory_Computing_for_Neural_Network_Applications.pdf
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    Type
    Article
    Authors
    Antolini, Alessio cc
    Paolino, Carmine cc
    Zavalloni, Francesco
    Lico, Andrea
    Scarselli, Eleonora Franchi cc
    Mangia, Mauro cc
    Pareschi, Fabio cc
    Setti, Gianluca cc
    Rovatti, Riccardo cc
    Torres, Mattia Luigi
    Carissimi, Marcella cc
    Pasotti, Marco cc
    KAUST Department
    Computer, Electrical and Mathematical Science and Engineering (CEMSE) Division
    Date
    2023-02-02
    Permanent link to this record
    http://hdl.handle.net/10754/687491
    
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    Abstract
    Matrix-Vector Multiplications (MVMs) represent a heavy workload for both training and inference in Deep Neural Networks (DNNs) applications. Analog In-memory Computing (AIMC) systems based on Phase Change Memory (PCM) has been shown to be a valid competitor to enhance the energy efficiency of DNN accelerators. Although DNNs are quite resilient to computation inaccuracies, PCM non-idealities could strongly affect MVM operations precision, and thus the accuracy of DNNs. In this paper, a combined hardware and software solution to mitigate the impact of PCM non-idealities is presented. The drift of PCM cells conductance is compensated at the circuit level through the introduction of a conductance ratio at the core of the MVM computation. A model of the behaviour of PCM cells is employed to develop a device-aware training for DNNs and the accuracy is estimated in a CIFAR-10 classification task. This work is supported by a PCM-based AIMC prototype, designed in a 90-nm STMicroelectronics technology, and conceived to perform Multiply-and-Accumulate (MAC) computations, which are the kernel of MVMs. Results show that the MAC computation accuracy is around 95% even under the effect of cells drift. The use of a device-aware DNN training makes the networks less sensitive to weight variability, with a 15% increase in classification accuracy over a conventionally-trained Lenet-5 DNN, and a 36% gain when drift compensation is applied.
    Citation
    Antolini, A., Paolino, C., Zavalloni, F., Lico, A., Scarselli, E. F., Mangia, M., Pareschi, F., Setti, G., Rovatti, R., Torres, M. L., Carissimi, M., & Pasotti, M. (2023). Combined HW/SW Drift and Variability Mitigation for PCM-based Analog In-memory Computing for Neural Network Applications. IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 1–1. https://doi.org/10.1109/jetcas.2023.3241750
    Sponsors
    This project has received funding from the ECSEL Joint Undertaking (JU) under grant agreement No 101007321. The JU receives support from the European Union’s Horizon 2020 research and innovation programme and France, Belgium, Czech Republic, Germany, Italy, Sweden, Switzerland, Turkey. The Authors wish to thank Chantal Auricchio and Laura Capecchi from STMicroelectronics Italy for their fundamental contribution to the testchip design and development.
    Publisher
    Institute of Electrical and Electronics Engineers (IEEE)
    Journal
    IEEE Journal on Emerging and Selected Topics in Circuits and Systems
    DOI
    10.1109/jetcas.2023.3241750
    Additional Links
    https://ieeexplore.ieee.org/document/10035378/
    ae974a485f413a2113503eed53cd6c53
    10.1109/jetcas.2023.3241750
    Scopus Count
    Collections
    Articles; Computer, Electrical and Mathematical Science and Engineering (CEMSE) Division

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