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dc.contributor.authorCarey, Graham H.
dc.contributor.authorLevina, Larissa
dc.contributor.authorComin, Riccardo
dc.contributor.authorVoznyy, Oleksandr
dc.contributor.authorSargent, Edward H.
dc.date.accessioned2021-10-14T12:26:15Z
dc.date.available2021-10-14T12:26:15Z
dc.date.issued2015
dc.identifier.citationCarey, G. H., Levina, L., Comin, R., Voznyy, O., & Sargent, E. H. (2015). Record Charge Carrier Diffusion Length in Colloidal Quantum Dot Solids via Mutual Dot-To-Dot Surface Passivation. Advanced Materials, 27(21), 3325–3330. doi:10.1002/adma.201405782
dc.identifier.issn1521-4095
dc.identifier.issn0935-9648
dc.identifier.doi10.1002/adma.201405782
dc.identifier.urihttp://hdl.handle.net/10754/672855
dc.description.sponsorshipThis publication is based in part on work supported by Award KUS-11-009-21, made by King Abdullah University of Science and Technology (KAUST), by the Ontario Research Fund Research Excellence Program, and by the Natural Sciences and Engineering Research Council. G.H.C. acknowledges funding support from the Vanier Canada Graduate Scholarship program. The authors thank Dr. F. Fan for TEM measurements, and R. Wolowiec and D. Kopilovic for technical assistance throughout these studies. Note: Figure 4 was reset on June 1, 2015, after initial publication online.
dc.publisherWILEY-V C H VERLAG GMBH
dc.relation.urlhttp://doi.wiley.com/10.1002/adma.201405782
dc.subjectcolloidal quantum dots
dc.subjectdiffusion length
dc.subjectsurface passivation
dc.subjectsurface-to-volume ratio
dc.titleRecord Charge Carrier Diffusion Length in Colloidal Quantum Dot Solids via Mutual Dot-To-Dot Surface Passivation
dc.typeArticle
dc.identifier.journalADVANCED MATERIALS
dc.identifier.wosutWOS:000355650300014
dc.contributor.institutionUniv Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
dc.identifier.volume27
dc.identifier.issue21
dc.identifier.pages3325-3330
kaust.grant.numberKUS-11-009-21
dc.identifier.eid2-s2.0-84928137878


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