Analysis of LO phonon properties in III-nitrides: interaction with carriers and microscopic analysis
Type
Conference PaperAuthors
Ishitani, YoshihiroOki, Kensuke
Chizaki, Masaya
Okamoto, Shungo
Nakayama, Tomoya
Lin, Bojin
Ma, Bei
Morita, Ken
Miyake, Hideto
Iida, Daisuke

Ohkawa, Kazuhiro

KAUST Department
Computer, Electrical and Mathematical Science and Engineering (CEMSE) DivisionElectrical and Computer Engineering Program
Physical Science and Engineering (PSE) Division
KAUST Grant Number
BAS/1/1676-01-01Date
2021-03-05Permanent link to this record
http://hdl.handle.net/10754/668105
Metadata
Show full item recordAbstract
Longitudinal optical (LO) phonon has strong electric interaction with particles and fields. Particularly, the interaction in III-nitrides is more significant than that in conventional III-V materials. We show phonon-exciton interaction properties in experimental PL spectrum analysis and theoretical calculation of population transfers of excitonic levels. Thermally nonequilibrium occupations of LO phonons and other modes generated by the LO-phonon decomposition are thought to shift the population distribution in principal quantum number states and kinetic energy to the higher energy side. The radiative exciton recombination lifetime is determined by the population distribution in the excitonic states, which is determined by the balance of the electronic and phononic elementary processes. The interaction of excitons and phonons releases the excess energy to the thermal bath of the lattice system, which sometimes yields negligible lattice temperature increase in the excited region or the nonequilibrium state between electron and phonon systems. A Raman scattering imaging measure is introduced to exhibit spatial transport of phonons generated by the energy relaxation and nonradiative recombination of the excited electrons and holes, where pump-probe measurements are enabled by the simultaneous irradiation of two laser beams. It is found that the phonon transport is blocked by the misfit dislocations located on a Ga0.84In0.16N/GaN heterointerface.Citation
Ishitani, Y., Oki, K., Chizaki, M., Okamoto, S., Nakayama, T., Lin, B., … Ohkawa, K. (2021). Analysis of LO phonon properties in III-nitrides: interaction with carriers and microscopic analysis. Gallium Nitride Materials and Devices XVI. doi:10.1117/12.2576776Sponsors
This study was partly supported by the Grant-in-Aid for Scientific Research of the Japan Society for the Promotion of Science (JP16H06415, JP16H06425, JP17H02772) and King Abdullah University of Science and Technology (KAUST) (BAS/1/1676-01-01)Publisher
SPIE-Intl Soc Optical EngConference/Event name
Physics, Simulation, and Photonic Engineering of Photovoltaic Devices XISBN
97815106420729781510642089
ae974a485f413a2113503eed53cd6c53
10.1117/12.2576776