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dc.contributor.authorHan, Yimo
dc.contributor.authorMuller, David
dc.contributor.authorXie, Saien
dc.contributor.authorPark, Jiwoong
dc.contributor.authorLi, Ming-yang
dc.contributor.authorLi, Lain-Jong
dc.date.accessioned2021-02-23T07:36:43Z
dc.date.available2021-02-23T07:36:43Z
dc.date.issued2020-07-30
dc.identifier.citationHan, Y., Muller, D., Xie, S., Park, J., Li, M.-Y., & Li, L.-J. (2020). Uncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions. Microscopy and Microanalysis, 26(S2), 1630–1631. doi:10.1017/s1431927620018784
dc.identifier.issn1431-9276
dc.identifier.issn1435-8115
dc.identifier.doi10.1017/s1431927620018784
dc.identifier.urihttp://hdl.handle.net/10754/667600
dc.description.abstractNext-generation, atomically thin devices require in-plane, one-dimensional heterojunctions to electrically connect different two-dimensional (2D) materials. However, the lattice mismatch between most 2D materials leads to unavoidable deformations including strain, dislocations, or wrinkles, which can strongly affect their mechanical, optical, and electronic properties. Transmission electron microscopy (TEM) and its related techniques have become indispensable tools in uncovering the structure and subsequent physical properties in these 2D materials, atom-by-atom. Here, we utilized a combination of atomic-resolution ADF-STEM and four-dimensional (4D) STEM mapping techniques to address how different 2D materials merge to form lateral heterostructures, specifically between two distinct transition metal dichalcogenides (TMDs) at various scales (Fig. 1).
dc.publisherCambridge University Press (CUP)
dc.relation.urlhttps://www.cambridge.org/core/product/identifier/S1431927620018784/type/journal_article
dc.rightsArchived with thanks to Microscopy and Microanalysis
dc.titleUncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions
dc.typeArticle
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalMicroscopy and Microanalysis
dc.rights.embargodate2021-01-30
dc.eprint.versionPost-print
dc.contributor.institutionRice University, Houston, Texas, United States.
dc.contributor.institutionCornell University, Ithaca, New York, United States.
dc.contributor.institutionUniversity of Chicago, Ithaca, New York, United States.
dc.contributor.institutionUniversity of Chicago, Chicago, Illinois, United States.
dc.contributor.institutionThe University of New South Wales, New South Wales, New South Wales, Australia.
dc.identifier.volume26
dc.identifier.issueS2
dc.identifier.pages1630-1631
kaust.personLi, Ming-yang


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