Large-Scale Sub-1-nm Random Gaps Approaching the Quantum Upper Limit for Quantitative Chemical Sensing
Type
ArticleKAUST Department
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) DivisionElectrical Engineering Program
Material Science and Engineering
Material Science and Engineering Program
Photonics Laboratory
Physical Science and Engineering (PSE) Division
Date
2020-10-27Embargo End Date
2021-10-28Submitted Date
2020-09-20Permanent link to this record
http://hdl.handle.net/10754/665736
Metadata
Show full item recordAbstract
Metallic nanostructures with nanogap features can confine electromagnetic fields into extremely small volumes. In particular, as the gap size is scaled down to sub-nanometer regime, the quantum effects for localized field enhancement reveal the ultimate capability for light–matter interaction. Although the enhancement factor approaching the quantum upper limit has been reported, the grand challenge for surface-enhanced vibrational spectroscopic sensing remains in the inherent randomness, preventing uniformly distributed localized fields over large areas. Herein, a strategy to fabricate high-density random metallic nanopatterns with accurately controlled nanogaps, defined by atomic-layer-deposition and self-assembled-monolayer processes, is reported. As the gap size approaches the quantum regime of ≈0.78 nm, its potential for quantitative sensing, based on a record-high uniformity with the relative standard deviation of 4.3% over a large area of 22 mm × 60 mm, is demonstrated. This superior feature paves the way towards more affordable and quantitative sensing using quantum-limit-approaching nanogap structures.Citation
Zhang, N., Hu, H., Singer, M., Li, K., Zhou, L., Ooi, B. S., & Gan, Q. (2020). Large-Scale Sub-1-nm Random Gaps Approaching the Quantum Upper Limit for Quantitative Chemical Sensing. Advanced Optical Materials, 2001634. doi:10.1002/adom.202001634Sponsors
This work was partially supported by NSF CMMI-1562057 and ECCS-1807463. The authors appreciate Dr. Lingmei Liu and Prof. Yu Han at KAUST for helpful suggestions on TEM characterization.Publisher
WileyJournal
Advanced Optical MaterialsAdditional Links
https://onlinelibrary.wiley.com/doi/10.1002/adom.202001634ae974a485f413a2113503eed53cd6c53
10.1002/adom.202001634