Asymptotic Analysis of MRT Over Double Scattering Channels With MMSE Estimation
Type
ArticleKAUST Department
Communication Theory LabComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Electrical Engineering
Electrical Engineering Program
Date
2020Submitted Date
2020-02-04Permanent link to this record
http://hdl.handle.net/10754/664599
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This paper studies the ergodic rate performance of maximum ratio transmission (MRT) precoding in the downlink of a multi-user multiple-input single-output (MISO) system, where the channel between the base station (BS) and each user is modeled using the double scattering model. We utilize the minimum-mean-square-error (MMSE) channel estimate for this model, which is used in the design of the MRT precoding. Within this setting, we are interested in deriving tight approximations of the ergodic rate under the assumption that the number of BS antennas (N), the number of users (K) and that of scatterers (S) grow large with the same pace. These approximations are expressed in simplified closed-form expressions for the special case of multi-keyhole channels. They reveal that unlike the standard Rayleigh channel in which the SINR grows as O(N/K), the SINR associated with a multi-keyhole channel scales as O(S/K). This particularly shows that the reaped gains of the large-scale MIMO over double scattering channels do not linearly increase with the number of antennas and are limited by the number of scatterers. We further provide simulation results that confirm the close match provided by the asymptotic analysis for moderate system dimensions and provide some useful insights into the interplay between N, K and S.Citation
Ye, J., Nadeem, Q.-U.-A., Kammoun, A., & Alouini, M.-S. (2020). Asymptotic Analysis of MRT Over Double Scattering Channels With MMSE Estimation. IEEE Transactions on Wireless Communications, 1–1. doi:10.1109/twc.2020.3017053Sponsors
This work was supported by a grant from the office of sponsored research at KAUST.Additional Links
https://ieeexplore.ieee.org/document/9174894/https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9174894
ae974a485f413a2113503eed53cd6c53
10.1109/TWC.2020.3017053