Investigation of a novel AlZnN semiconductor alloy

License
http://creativecommons.org/licenses/by/4.0/

Type
Article

Authors
Trapalis, A.
Fry, P. W.
Kennedy, Kenneth Leslie
Farrer, I.
Kean, A.
Sharman, J.
Heffernan, J.

KAUST Department
Cleanroom Operations

Online Publication Date
2020-07-20

Print Publication Date
2020-09

Date
2020-07-20

Submitted Date
2020-05-22

Abstract
The formation of an AlZnN alloy was investigated as a route to tune the bandgap of Zn3N2. A significant shift of the bandgap was observed in the deposited films, increasing from 1.4 eV for Zn3N2 to 2.8 eV for AlZnN alloys with an AlN fraction of × = 0.19. The refractive index followed a similar trend, approaching that of AlN. The charge carrier density of AlZnN samples was significantly reduced reaching values in the order of 1016 cm−3.

Citation
Trapalis, A., Fry, P. W., Kennedy, K., Farrer, I., Kean, A., Sharman, J., & Heffernan, J. (2020). Investigation of a novel AlZnN semiconductor alloy. Materials Letters: X, 7, 100052. doi:10.1016/j.mlblux.2020.100052

Acknowledgements
The authors wish to acknowledge funding by the EPSRC (Engineering and Physical Science Research Council, EP/M507611/1) the two funders contributed to the same grant ID in an Industrial CASE Award and Johnson Matthey PLC (Award No. 14550005). The data presented in this paper is available to download for free with the following DOI: 10.15131/shef.data.12327560.

Publisher
Elsevier BV

Journal
Materials Letters: X

DOI
10.1016/j.mlblux.2020.100052

Additional Links
https://linkinghub.elsevier.com/retrieve/pii/S2590150820300156http://eprints.whiterose.ac.uk/164071/1/1-s2.0-S2590150820300156-main.pdf

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