Magneto-transport Mechanism of Individual Nanostructures via Direct Magnetoresistance Measurement in situ SEM
Type
ArticleAuthors
Zhang, JunweiPeng, Yong
Ma, Hongbin
Zhang, Senfu

Hu, Yang
Zeng, Xue
Deng, Xia
Guan, Chaoshuai
Chen, Rongrong
Hu, Yue
Karim, Abdul
Tao, Kun
Zhang, Mingjie
Zhang, Xixiang

KAUST Department
Physical Science and Engineering (PSE) DivisionMaterial Science and Engineering Program
Date
2020-08-05Online Publication Date
2020-08-05Print Publication Date
2020-09-02Embargo End Date
2021-08-05Permanent link to this record
http://hdl.handle.net/10754/664512
Metadata
Show full item recordAbstract
The accurate magnetoresistance (MR) measurement of individual nanostructures is essential and important for either the enrichment of fundamental knowledge of magneto-transport mechanism or the facilitation of desired design of magnetic nanostructures for various technological applications. Herein, we report a deep investigation on the magneto-transport mechanism of single CoCu/Cu multilayered nanowire via direct magnetoresistance measurement by using our invented magnetotransport instrument in-situ scanning electron microscope (SEM). Off-axis electron holography experiments united with micromagnetic simulation prove that the CoCu layers in CoCu/Cu multilayered nanowires are formed a single-domain structure, in which the alignment of magnetic moments is mainly determined by shape anisotropy. The MR of the single CoCu/Cu multilayered nanowire is measured to be only 1.14% when the varied external field is applied along nanowire length axis, which matches with the theoretical prediction of Granular Films model. Density functional theory (DFT) calculations further disclose that spin-dependent scattering at the interface between magnetic and nonmagnetic layers is responsible for the intrinsic magnetotransport mechanismCitation
Zhang, J., Peng, Y., Ma, H., Zhang, S., Hu, Y., Zeng, X., … Zhang, X. (2020). Magneto-transport Mechanism of Individual Nanostructures via Direct Magnetoresistance Measurement in situ SEM. ACS Applied Materials & Interfaces. doi:10.1021/acsami.0c09773Sponsors
This work was supported by National Natural Science Foundation of China (51771085, 51801087, 91962212 and 51571104), the Fundamental Research Funds for the Central Universities (lzujbky-2020-58).Publisher
American Chemical Society (ACS)Additional Links
https://pubs.acs.org/doi/10.1021/acsami.0c09773ae974a485f413a2113503eed53cd6c53
10.1021/acsami.0c09773