Systematic Study on Morphological Development of Blade-Coated Conjugated Polymer Thin Films via In Situ Measurements
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2021-07-07
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ArticleAuthors
Kim, Yeon-JuLee, Sehyun
Niazi, Muhammad Rizwan

Hwang, Kyoungtae
Tang, Ming-Chun
Lim, Dae-Hee
Kang, Ji-Sue
Smilgies, Detlef-M.
Amassian, Aram

Kim, Dong-Yu
KAUST Department
Academic AffairsKAUST Solar Center (KSC)
Material Science and Engineering
Material Science and Engineering Program
Office of the VP
Organic Electronics and Photovoltaics Group
Physical Science and Engineering (PSE) Division
Date
2020-07-07Online Publication Date
2020-07-07Print Publication Date
2020-08-12Embargo End Date
2021-07-07Permanent link to this record
http://hdl.handle.net/10754/664161
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The morphology of conjugated polymer thin films, determined by the kinetics of film drying, is closely correlated with their electrical properties. Herein, we focused on dramatic changes in thin film morphology of blade-coated poly{[N,N′-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5′-(2,2′-bithiophene)} caused by the effect of solvent and coating temperature. Through in situ measurements the evolution of polymer aggregates and crystallites, which plays a decisive role in the formation of the charge transporting pathway, was observed in real-time. By combining in situ ultraviolet-visible spectroscopy and in situ grazing-incidence wide-angle X-ray scattering analysis, we could identify five distinct stages during the blade-coating process; these stages were observed irrespective of the solvent and coating temperature used. The five stages are described in detail with a proposed model of film formation. This insight is an important step in understanding the relationship between the morphology of thin polymer films and their charge-transport properties as well as optimizing the structural evolution of thin films.Citation
Kim, Y.-J., Lee, S., Niazi, M. R., Hwang, K., Tang, M.-C., Lim, D.-H., … Kim, D.-Y. (2020). Systematic Study on Morphological Development of Blade-Coated Conjugated Polymer Thin Films via In Situ Measurements. ACS Applied Materials & Interfaces. doi:10.1021/acsami.0c07385Sponsors
The authors would like to thank the Korea Basic Science Institute (KBSI) for AFM measurements.Publisher
American Chemical Society (ACS)Additional Links
https://pubs.acs.org/doi/10.1021/acsami.0c07385ae974a485f413a2113503eed53cd6c53
10.1021/acsami.0c07385