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dc.contributor.authorLin, Ronghui
dc.contributor.authorAlnakhli, Zahrah
dc.contributor.authorAlqatari, Feras
dc.contributor.authorLi, Xiao-Hang
dc.date.accessioned2020-07-08T08:00:40Z
dc.date.available2020-07-08T08:00:40Z
dc.date.issued2020-07-07
dc.identifier.citationLin, R., Alnakhli, Z., AlQatari, F., & Li, X. (2020). Analysis of Tapered Nanopillars for Reflective Metalens: The Role of Higher-Order Modes. IEEE Photonics Journal, 12(4), 1–7. doi:10.1109/jphot.2020.3007489
dc.identifier.issn2156-3403
dc.identifier.doi10.1109/JPHOT.2020.3007489
dc.identifier.urihttp://hdl.handle.net/10754/664082
dc.description.abstractDespite the widespread interest in the metalens technology, few works show the errors during fabrication and analyze how they influence the focusing performance. In this work, we proposed a reflective metalens design and carry out a fundamental study on how a mild tapering angle (<6) of the nanopillars would influence the performance of a reflective metalens. By analyzing the interaction of Mie resonance in the lateral direction and Fabry-Prot resonance in the longitudinal direction using numerical simulations, we reveal the detrimental role the tapering angle plays due to the low transmission near the resonance. We observe the weakening of the electric quadrupole and magnetic dipole response, and the increase of the electric dipole response for tapered nanopillars. Moreover, the Fabry-Prot resonance is disturbed due to the broken symmetry. These factors contribute to lower Q factor resonance and hence the low transmission. The results presented in this work can guide the analysis of fabrication errors and provide insights on how to compensate them.
dc.description.sponsorshipThe authors would like to acknowledge the support of KAUST Baseline Fund BAS/1/1664-01-01, and Competitive Research Grants URF/1/3437-01-01 and URF/1/3771-01-01
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.urlhttps://ieeexplore.ieee.org/document/9134910/
dc.relation.urlhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9134910
dc.relation.urlhttps://ieeexplore.ieee.org/ielx7/5503869/5986669/09134910.pdf
dc.rightsThis is an open access article licensed under a Creative Commons Attribution 4.0 License.
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subject: Metalens
dc.subjectMie resonance
dc.subjectFabry-Perot resonance
dc.titleAnalysis of tapered nanopillars for reflective metalens: the role of higher-order modes
dc.typeArticle
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentElectrical Engineering
dc.contributor.departmentElectrical Engineering Program
dc.contributor.departmentMaterial Science and Engineering Program
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalIEEE Photonics Journal
dc.eprint.versionPost-print
dc.contributor.institutionElectrical and Computer Engineering, Lehigh University, Bethelehem, Pennsylvania, United States, 18015
kaust.personLin, Ronghui
kaust.personAlnakhli, Zahrah
kaust.personAlqatari, Feras
kaust.grant.numberBAS/1/1664-01-01
kaust.grant.numberURF/1/3437-01-01
kaust.grant.numberURF/1/3771-01-01
refterms.dateFOA2020-07-08T08:02:41Z
kaust.acknowledged.supportUnitCompetitive Research
dc.date.published-online2020-07-07
dc.date.published-print2020-08


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