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dc.contributor.authorChen, Zhen
dc.contributor.authorOdstrcil, Michal
dc.contributor.authorJiang, Yi
dc.contributor.authorHan, Yimo
dc.contributor.authorChiu, Ming-Hui
dc.contributor.authorLi, Lain-Jong
dc.contributor.authorMuller, David A.
dc.date.accessioned2020-06-15T10:42:54Z
dc.date.available2020-06-15T10:42:54Z
dc.date.issued2020-06-12
dc.date.submitted2019-09-14
dc.identifier.citationChen, Z., Odstrcil, M., Jiang, Y., Han, Y., Chiu, M.-H., Li, L.-J., & Muller, D. A. (2020). Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose. Nature Communications, 11(1). doi:10.1038/s41467-020-16688-6
dc.identifier.issn2041-1723
dc.identifier.pmid32533001
dc.identifier.doi10.1038/s41467-020-16688-6
dc.identifier.urihttp://hdl.handle.net/10754/663576
dc.description.abstractBoth high resolution and high precision are required to quantitatively determine the atomic structure of complex nanostructured materials. However, for conventional imaging methods in scanning transmission electron microscopy (STEM), atomic resolution with picometer precision cannot usually be achieved for weakly-scattering samples or radiation-sensitive materials, such as 2D materials. Here, we demonstrate low-dose, sub-angstrom resolution imaging with picometer precision using mixed-state electron ptychography. We show that correctly accounting for the partial coherence of the electron beam is a prerequisite for high-quality structural reconstructions due to the intrinsic partial coherence of the electron beam. The mixed-state reconstruction gains importance especially when simultaneously pursuing high resolution, high precision and large field-of-view imaging. Compared with conventional atomic-resolution STEM imaging techniques, the mixed-state ptychographic approach simultaneously provides a four-times-faster acquisition, with double the information limit at the same dose, or up to a fifty-fold reduction in dose at the same resolution.
dc.description.sponsorshipZ.C. and D.A.M. are supported by the PARADIM Materials Innovation Platform program in-house program by NSF Grant DMR-1539918. Y.H. is supported by the NSF MRSEC program (DMR-1429155). This work made use of the Cornell Center for Materials Research facility supported by NSF grant DMR-1719875. We thank Tsai Esther Hsiao Rho and Manuel Guizar-Sicairos for useful discussions.
dc.publisherSpringer Nature
dc.relation.urlhttp://www.nature.com/articles/s41467-020-16688-6
dc.relation.urlhttps://www.nature.com/articles/s41467-020-16688-6.pdf
dc.rightsThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder.
dc.rights.urihttps://creativecommons.org/licenses/by/4.0
dc.titleMixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose.
dc.typeArticle
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.contributor.departmentMaterial Science and Engineering Program
dc.identifier.journalNature communications
dc.eprint.versionPublisher's Version/PDF
dc.contributor.institutionSchool of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
dc.contributor.institutionPaul Scherrer Institut, 5232 Villigen PSI, Switzerland.
dc.contributor.institutionPresent address: Carl Zeiss SMT, Carl-Zeiss-Straße 22, 73447 Oberkochen, Germany.
dc.contributor.institutionAdvanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
dc.contributor.institutionPresent address: Department of Molecular Biology, Princeton University, Princeton, NJ 08544, USA.
dc.contributor.institutionPresent address: Department of Electronic Engineering and Green Technology Research Center, Chang-Gung University, Taoyuan 333, Taiwan.
dc.contributor.institutionKavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA.
dc.identifier.volume11
dc.identifier.issue1
kaust.personChiu, Ming-Hui
kaust.personLi, Lain-Jong
dc.date.accepted2020-05-13
dc.relation.issupplementedbyDOI:10.34863/g4wa-0j57
refterms.dateFOA2020-06-15T10:43:50Z
display.relations<b>Is Supplemented By:</b><br/> <ul><li><i>[Dataset]</i> <br/> Chen, Z., Odstrcil, M., Jiang, Y., Han, Y., Chiu, M.-H., Li, L.-J., &amp; Muller, D. (2020). <i>Dataset: Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose</i> [Data set]. PARADIM, an NSF Materials Innovation Platform. https://doi.org/10.34863/G4WA-0J57. DOI: <a href="https://doi.org/10.34863/g4wa-0j57" >10.34863/g4wa-0j57</a> Handle: <a href="http://hdl.handle.net/10754/668436" >10754/668436</a></a></li></ul>
dc.date.published-online2020-06-12
dc.date.published-print2020-12


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This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder.
Except where otherwise noted, this item's license is described as This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder.