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dc.contributor.authorYang, Yang
dc.contributor.authorZhang, Qiang
dc.contributor.authorMi, Wenbo
dc.contributor.authorZhang, Xixiang
dc.date.accessioned2020-06-03T12:42:00Z
dc.date.available2020-06-03T12:42:00Z
dc.date.issued2020-05-25
dc.date.submitted2020-04-02
dc.identifier.citationYang, Y., Zhang, Q., Mi, W., & Zhang, X. (2020). Lattice deformation in epitaxial Fe3O4 films on MgO substrate studied by polarized Raman spectroscopy. Chinese Physics B. doi:10.1088/1674-1056/ab9615
dc.identifier.issn1674-1056
dc.identifier.doi10.1088/1674-1056/ab9615
dc.identifier.urihttp://hdl.handle.net/10754/662994
dc.description.abstractThe lattice structures of epitaxial Fe3O4 films deposited on MgO were studied systematically using polarized Raman spectroscopy as a function of film thickness, where interesting phenomena were observed. Firstly, the spectral conflict to the Raman selection rules (RSRs) was observed under cross sectional configuration, which can be attributed to the tetragonal deformation in the growth direction due to the lattice mismatch between Fe3O4 and MgO. Secondly, the blue-shift and broadening of Raman peaks evidenced the decrease of the tensile strain in Fe3O4 film with decreased thickness. Thirdly, distinct from the other Raman modes, the lowest T 2g mode exhibited asymmetric lineshape, which can be interpreted using the spatial correlation model. The increased correlation length introduced in the model can well explain the enhanced peak asymmetry feature with decreasing thickness. These results provide useful information for understanding the lattice structure of epitaxial Fe3O4 film.
dc.publisherIOP Publishing
dc.relation.urlhttps://iopscience.iop.org/article/10.1088/1674-1056/ab9615
dc.rightsThis is an author-created, un-copyedited version of an article accepted for publication/published in Chinese Physics B. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at http://doi.org/10.1088/1674-1056/ab9615
dc.titleLattice deformation in epitaxial Fe3O4 films on MgO substrate studied by polarized Raman spectroscopy∗
dc.typeArticle
dc.contributor.departmentImaging and Characterization Core Lab
dc.contributor.departmentNanofabrication Core Lab
dc.contributor.departmentThin Films & Characterization
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.contributor.departmentMaterial Science and Engineering Program
dc.identifier.journalChinese Physics B
dc.rights.embargodate2021-05-25
dc.eprint.versionPost-print
dc.contributor.institutionBeijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, CHINA.
dc.contributor.institutionTianjin Key Laboratory of Low Dimensional Materials Physics and Preparation Technology, School of Science, Tianjin University, Tianjin, 300354, CHINA.
kaust.personZhang, Qiang
kaust.personZhang, Xixiang
dc.date.accepted2020-05-23


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