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dc.contributor.authorOgieglo, Wojciech
dc.contributor.authorIdarraga-Mora, Jaime A.
dc.contributor.authorHusson, Scott M.
dc.contributor.authorPinnau, Ingo
dc.date.accessioned2020-04-30T09:11:23Z
dc.date.available2020-04-30T09:11:23Z
dc.date.issued2020-04-29
dc.date.submitted2019-11-19
dc.identifier.citationOgieglo, W., Idarraga-Mora, J. A., Husson, S. M., & Pinnau, I. (2020). Direct ellipsometry for non-destructive characterization of interfacially-polymerized thin-film composite membranes. Journal of Membrane Science, 118174. doi:10.1016/j.memsci.2020.118174
dc.identifier.issn0376-7388
dc.identifier.doi10.1016/j.memsci.2020.118174
dc.identifier.urihttp://hdl.handle.net/10754/662686
dc.description.abstractIn this work, we developed and validated a non-destructive and expedient ellipsometry method for the direct characterization of interfacially-polymerized (IP) selective layers in thin-film composite membranes, such as those used in reverse osmosis (RO) or nanofiltration (NF). The primary advantages of this method are direct analysis of membrane samples and avoidance of IP layer isolation. IP layer isolation has proved to be extremely useful in the past but is also laborious, requires hazardous solvents, and carries significant risks of damage or alteration of the layer morphology if not done correctly. The new ellipsometry method was used to characterize IP layer morphology, including thickness and roughness, and produced results that agree fairly well with measurements by scanning/transmission electron microscopy and atomic force microscopy. Moreover, given the non-intrusiveness of the ellipsometric measurements, dynamic in-situ studies of RO membranes exposed to fluids were demonstrated. Findings from this study are expected to catalyze the further development and application of ellipsometry as a tool for characterizing TFC membrane selective layers and observing their real-time responses to process fluids, chemical and physical stimuli (pH, temperature, etc.), and cleaning agents.
dc.description.sponsorshipS.M.H. thanks the U.S. National Science Foundation (NSF) for funding under Award CBET-1510790. Opinions, findings, and conclusions or recommendations expressed in this material are those of the authors and they do not necessarily reflect the views of the NSF. S.M.H. and J. I-M. thanks the support from the Clemson Electron Microscope Laboratory. I.P. gratefully acknowledges baseline funding provided by KAUST (BAS/1/1323-01-01). W.O. appreciates the possibility to extensively use the facilities of the KAUST Solar Center.
dc.publisherElsevier BV
dc.relation.urlhttps://linkinghub.elsevier.com/retrieve/pii/S0376738820307523
dc.rightsNOTICE: this is the author’s version of a work that was accepted for publication in Journal of Membrane Science. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Membrane Science, [, , (2020-04-29)] DOI: 10.1016/j.memsci.2020.118174 . © 2020. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.titleDirect ellipsometry for non-destructive characterization of interfacially-polymerized thin-film composite membranes
dc.typeArticle
dc.contributor.departmentAdvanced Membranes and Porous Materials Research Center
dc.contributor.departmentChemical Engineering Program
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalJournal of Membrane Science
dc.rights.embargodate2022-04-29
dc.eprint.versionPost-print
dc.contributor.institutionDepartment of Chemical and Biomolecular Engineering, Clemson University, 127 Earle Hall, Clemson, SC, 29634-0909, USA.
dc.identifier.pages118174
kaust.personOgieglo, Wojciech
kaust.personPinnau, Ingo
kaust.grant.numberBAS/1/1323-01-01
dc.date.accepted2020-04-07
kaust.acknowledged.supportUnitKAUST Solar Center
dc.date.published-online2020-04-29
dc.date.published-print2020-08


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