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dc.contributor.authorWang, Congli
dc.contributor.authorFu, Qiang
dc.contributor.authorDun, Xiong
dc.contributor.authorHeidrich, Wolfgang
dc.date.accessioned2020-01-19T06:18:26Z
dc.date.available2020-01-19T06:18:26Z
dc.date.issued2019-08-29
dc.date.submitted2016-11-01
dc.identifier.urihttp://hdl.handle.net/10754/661062
dc.description.abstractA wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.
dc.relation.urlhttps://patents.google.com/patent/US20190265107A1/en
dc.titleWavefront Sensor and Method of Reconstructing Distorted Wavefronts
dc.typePatent
dc.contributor.departmentVisual Computing Center
dc.contributor.departmentComputer, Electrical and Mathematical Science and Engineering Division
dc.description.statusPending/Filed Application
dc.contributor.assigneeKing Abdullah University of Science and Technology (KAUST)
dc.description.countryUnited States
dc.identifier.patentnumberUS 2019/0265107 A1
dc.identifier.applicationnumber62/415,829
refterms.dateFOA2020-01-19T06:18:26Z


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