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    Ultrasensitive broadband infrared 4 × 4 Mueller-matrix ellipsometry for studies of depolarizing and anisotropic thin films

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    Name:
    JVB19-AR-ICSE2019-00450.pdf
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    PDF
    Description:
    Accepted manuscript
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    Type
    Article
    Authors
    Furchner, Andreas cc
    Kratz, Christoph cc
    Ogieglo, Wojciech
    Pinnau, Ingo cc
    Rappich, Jörg
    Hinrichs, Karsten cc
    KAUST Department
    Advanced Membranes and Porous Materials Research Center
    Chemical Engineering Program
    Physical Science and Engineering (PSE) Division
    KAUST Grant Number
    BAS/1/1323-01-01
    Date
    2019-12-18
    Online Publication Date
    2019-12-18
    Print Publication Date
    2020-01
    Embargo End Date
    2020-12-18
    Permanent link to this record
    http://hdl.handle.net/10754/660871
    
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    Abstract
    The authors present a second-generation broadband 4×4 Mueller-matrix (MM) ellipsometer for ultrasensitive infrared-spectroscopic (8000−800cm−1) studies of complex nanometer-thin films. In a modular design, the instrument employs retractable achromatic retarders and various sets of tandem polarizers. Using high-transmittance free-standing wire-grid polarizers, the device reaches an unparalleled precision of up to 5⋅10−5 in the important fingerprint region, even for block-offdiagonal MM elements. Broadband and signal-to-noise optimized access to the full 4×4 MM provides in-depth information on the sample’s polarimetric properties and opens the door for detailed explorations of depolarizing and anisotropic materials. The authors discuss examples of highly depolarizing nonuniform polyimide membranes, uniaxial-to-biaxial anisotropy changes in ultrathin polymer films, and azimuthal off-axis effects in 2D-structured silica arrays. Diverse optical modeling approaches based upon anisotropic layer stacks and rigorous coupled-wave analysis are used to quantify the optical, structural, and chemical properties of the sample.
    Citation
    Furchner, A., Kratz, C., Ogieglo, W., Pinnau, I., Rappich, J., & Hinrichs, K. (2020). Ultrasensitive broadband infrared 4 × 4 Mueller-matrix ellipsometry for studies of depolarizing and anisotropic thin films. Journal of Vacuum Science & Technology B, 38(1), 014003. doi:10.1116/1.5129800
    Sponsors
    The authors are indebted to Matthias Zellmeier (HZB Berlin) for the preparation of the trapezoidal SiO2 arrays, to Timur Shaykhutdinov for expertise in RCWA simulations, to Uwe Richter (Sentech Instruments GmbH), as well as Ilona Engler, Cordula Walder, and Özgür Savaş for technical assistance, to Margarita Günther (TU Dresden) and Karin Sahre and Klaus-Jochen Eichhorn (IPF Dresden) for providing the PI2611 samples, and to Sentech Instruments GmbH for construction of the retarder units. Financial support through European Union grants (EFRE 1.8/13, ProFIT Nos. 10160255, 10160265, and 10160256) as well as by the Ministerium für Innovation, Wissenschaft und Forschung des Landes Nordrhein-Westfalen, the Regierende Bürgermeister von Berlin—Senatskanzlei Wissenschaft und Forschung, and the Bundesministerium für Bildung und Forschung is gratefully acknowledged. I.P. acknowledges support from KAUST (baseline funding No. BAS/1/1323-01-01)
    Publisher
    American Vacuum Society
    Journal
    Journal of Vacuum Science & Technology B
    DOI
    10.1116/1.5129800
    Additional Links
    http://avs.scitation.org/doi/10.1116/1.5129800
    https://avs.scitation.org/doi/pdf/10.1116/1.5129800
    ae974a485f413a2113503eed53cd6c53
    10.1116/1.5129800
    Scopus Count
    Collections
    Articles; Advanced Membranes and Porous Materials Research Center; Physical Science and Engineering (PSE) Division; Chemical Engineering Program

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