Quantitative Phase and Intensity Microscopy Using Snapshot White Light Wavefront Sensing
KAUST DepartmentElectrical Engineering Program
Visual Computing Center (VCC)
Computer Science Program
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Online Publication Date2019-09-24
Print Publication Date2019-12
Permanent link to this recordhttp://hdl.handle.net/10754/656921
MetadataShow full item record
AbstractPhase imaging techniques are an invaluable tool in microscopy for quickly examining thin transparent specimens. Existing methods are limited to either simple and inexpensive methods that produce only qualitative phase information (e.g. phase contrast microscopy, DIC), or significantly more elaborate and expensive quantitative methods. Here we demonstrate a low-cost, easy to implement microscopy setup for quantitative imaging of phase and bright field amplitude using collimated white light illumination.
CitationWang, C., Fu, Q., Dun, X., & Heidrich, W. (2019). Quantitative Phase and Intensity Microscopy Using Snapshot White Light Wavefront Sensing. Scientific Reports, 9(1). doi:10.1038/s41598-019-50264-3
SponsorsThe authors thank Dr. Fathia Ben Rached, Ioannis Isaioglou, Shahad Alsaiari, and Michael Margineanu for their help in preparing the biological specimens. This work was supported by King Abdullah University of Science and Technology Individual Baseline Funding, as well as Center Partnership Funding.
RelationsIs Supplemented By:
Title: vccimaging/PhaseIntensityMicroscope: This is the open source repository for our Scientific Reports paper "Quantitative Phase and Intensity microscopy Using Snapshot White Light Wavefront Sensing".. Publication Date: 2019-09-10. github: vccimaging/PhaseIntensityMicroscope Handle: 10754/667374