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dc.contributor.authorYilmaz, Ferkan
dc.contributor.authorAlouini, Mohamed-Slim
dc.date.accessioned2019-01-08T05:33:18Z
dc.date.available2019-01-08T05:33:18Z
dc.date.issued2018-07-09
dc.identifier.citationYilmaz F, Alouini M-S (2018) On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels. 2018 26th Signal Processing and Communications Applications Conference (SIU). Available: http://dx.doi.org/10.1109/siu.2018.8404425.
dc.identifier.doi10.1109/siu.2018.8404425
dc.identifier.urihttp://hdl.handle.net/10754/630741
dc.description.abstractThis paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.rightsArchived with thanks to 2018 26th Signal Processing and Communications Applications Conference (SIU)
dc.subjectFading channels
dc.subjectBinary phase shift keying
dc.subjectLaplace equations
dc.subjectAdditive noise
dc.subjectGaussian distribution
dc.subjectComputational modeling
dc.titleOn the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels
dc.typeConference Paper
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentElectrical Engineering Program
dc.identifier.journal2018 26th Signal Processing and Communications Applications Conference (SIU)
dc.eprint.versionPublisher's Version/PDF
dc.contributor.institutionComputer Engineering Department, Faculty of Electrical & Electonics Engineering, Yıldız Technical University (YTU), Esenler, Istanbul, Turkey
kaust.personAlouini, Mohamed-Slim
dc.date.published-online2018-07-09
dc.date.published-print2018-05


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