On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels
KAUST DepartmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Electrical Engineering Program
Online Publication Date2018-07-09
Print Publication Date2018-05
Permanent link to this recordhttp://hdl.handle.net/10754/630741
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AbstractThis paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.
CitationYilmaz F, Alouini M-S (2018) On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels. 2018 26th Signal Processing and Communications Applications Conference (SIU). Available: http://dx.doi.org/10.1109/siu.2018.8404425.