On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels
Type
Conference PaperKAUST Department
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) DivisionElectrical Engineering Program
Date
2018-07-09Online Publication Date
2018-07-09Print Publication Date
2018-05Permanent link to this record
http://hdl.handle.net/10754/630741
Metadata
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This paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.Citation
Yilmaz F, Alouini M-S (2018) On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels. 2018 26th Signal Processing and Communications Applications Conference (SIU). Available: http://dx.doi.org/10.1109/siu.2018.8404425.ae974a485f413a2113503eed53cd6c53
10.1109/siu.2018.8404425