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dc.contributor.authorVarga, Laszlo
dc.contributor.authorVARGA,Bonbien
dc.contributor.authorCALO,Victor
dc.date.accessioned2019-01-07T07:15:34Z
dc.date.available2019-01-07T07:15:34Z
dc.date.issued2018-02-02
dc.date.submitted2016-04-14
dc.identifier.urihttp://hdl.handle.net/10754/630734
dc.description.abstractVarious examples for the x- ray imaging of the microstructure of the material is provided. In one embodiment, a system for non-destructive material inspection x- ray source configured to produce a beam spot on the inspected object; Grid detector configured to receive the x- ray diffraction from the subject; And a computing device configured to determine the microstructure of the image based at least in part on the x- ray diffraction pattern of the diffraction from the subject. In another example, the method of determining the microstructure of the material is illuminated with the beam spot to a beam of incident jaeryosang x- ray; A grid detector to detect the x- ray diffraction from the material; And it includes determining by the microstructure of the image to the computing device based at least in part on the diffraction patterns of the x- ray diffraction from the material.
dc.relation.urlhttps://patents.google.com/patent/KR20180011757A/en
dc.titlex- ray diffraction imaging of the material microstructure
dc.typePatent
dc.description.statusPublished Application
dc.contributor.assigneeKing Abdullah University of Science and Technology (KAUST)
dc.identifier.applicationnumberUS20180120244A1
dc.identifier.applicationnumberEP3283872A1
dc.identifier.applicationnumberKR20180011757A
dc.identifier.applicationnumberCN107533021A
dc.identifier.applicationnumberWO2016166704A1
refterms.dateFOA2019-01-07T07:15:38Z


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