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    x- ray diffraction imaging of the material microstructure

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    US20180120244A1.pdf
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    Description:
    Patent
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    Type
    Patent
    Patent Status
    Published Application
    Authors
    Varga, Laszlo
    VARGA,Bonbien
    CALO,Victor
    Assignee
    King Abdullah University of Science and Technology (KAUST)
    Date
    2018-02-02
    Submitted Date
    2016-04-14
    Permanent link to this record
    http://hdl.handle.net/10754/630734
    
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    Abstract
    Various examples for the x- ray imaging of the microstructure of the material is provided. In one embodiment, a system for non-destructive material inspection x- ray source configured to produce a beam spot on the inspected object; Grid detector configured to receive the x- ray diffraction from the subject; And a computing device configured to determine the microstructure of the image based at least in part on the x- ray diffraction pattern of the diffraction from the subject. In another example, the method of determining the microstructure of the material is illuminated with the beam spot to a beam of incident jaeryosang x- ray; A grid detector to detect the x- ray diffraction from the material; And it includes determining by the microstructure of the image to the computing device based at least in part on the diffraction patterns of the x- ray diffraction from the material.
    Application Number
    US20180120244A1
    EP3283872A1
    KR20180011757A
    CN107533021A
    WO2016166704A1
    Additional Links
    https://patents.google.com/patent/KR20180011757A/en
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