Type
PatentPatent Status
Published ApplicationDate
2018-02-02Submitted Date
2016-04-14Permanent link to this record
http://hdl.handle.net/10754/630734
Metadata
Show full item recordAbstract
Various examples for the x- ray imaging of the microstructure of the material is provided. In one embodiment, a system for non-destructive material inspection x- ray source configured to produce a beam spot on the inspected object; Grid detector configured to receive the x- ray diffraction from the subject; And a computing device configured to determine the microstructure of the image based at least in part on the x- ray diffraction pattern of the diffraction from the subject. In another example, the method of determining the microstructure of the material is illuminated with the beam spot to a beam of incident jaeryosang x- ray; A grid detector to detect the x- ray diffraction from the material; And it includes determining by the microstructure of the image to the computing device based at least in part on the diffraction patterns of the x- ray diffraction from the material.Application Number
US20180120244A1EP3283872A1
KR20180011757A
CN107533021A
WO2016166704A1