Patent StatusPublished Application
Permanent link to this recordhttp://hdl.handle.net/10754/630734
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AbstractVarious examples for the x- ray imaging of the microstructure of the material is provided. In one embodiment, a system for non-destructive material inspection x- ray source configured to produce a beam spot on the inspected object; Grid detector configured to receive the x- ray diffraction from the subject; And a computing device configured to determine the microstructure of the image based at least in part on the x- ray diffraction pattern of the diffraction from the subject. In another example, the method of determining the microstructure of the material is illuminated with the beam spot to a beam of incident jaeryosang x- ray; A grid detector to detect the x- ray diffraction from the material; And it includes determining by the microstructure of the image to the computing device based at least in part on the diffraction patterns of the x- ray diffraction from the material.