Waveguide Dispersion Tailoring by Using Embedded Impedance Surfaces
KAUST DepartmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Electrical Engineering Program
KAUST Grant NumberCRG-2953
Permanent link to this recordhttp://hdl.handle.net/10754/630279
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AbstractThe capability to tailor the dispersion and the cut-off frequency of waveguides is of importance, as these essential parameters govern the operating frequency range and the waveguide dimension. Here, we propose the concept of substrate-integrated impedance surface (SIIS) that enables arbitrary control of propagation characteristics of closed-shape waveguides. Specifically, we develop a theoretical framework for the simplest form of SIIS constituted by a one-dimensional array of blind vias, which is equivalent to a homogenized surface capacitance embedded in the waveguide. We theoretically and experimentally demonstrate that loading a substrate-integrated waveguide (SIW) with a capacitive SIIS can effectively reduce its cut-off frequency, regardless of the transverse dimension of the SIW. In addition, a SIIS-loaded SIW exhibits several intriguing phenomena, such as the slow-wave guiding properties and the local field concentration. This SIIS-loading technique may open up new possibilities for miniaturization of various waveguide-based components and for enhancement of their uses in microwave sensing and nonlinear functions.
CitationHe Y, Li Y, Zhu L, Bagci H, Erricolo D, et al. (2018) Waveguide Dispersion Tailoring by Using Embedded Impedance Surfaces. Physical Review Applied 10. Available: http://dx.doi.org/10.1103/physrevapplied.10.064024.
SponsorsThis work is supported by the National Natural Science Foundation of China Grant No. 61771280. P.Y.C. and H.B. would like to thank KAUST Grant No. CRG-2953 for supporting the research reported in this publication.
PublisherAmerican Physical Society (APS)
JournalPhysical Review Applied