Extremely Flexible Indium-Gallium-Zinc Oxide (IGZO) Based Electronic Devices Placed on an Ultrathin Poly(Methyl Methacrylate) (PMMA) Substrate
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ArticleKAUST Department
Physical Science and Engineering (PSE) DivisionDate
2018-05-31Online Publication Date
2018-05-31Print Publication Date
2018-07Permanent link to this record
http://hdl.handle.net/10754/628269
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The flexibility of metal oxide-based electronic devices is severely limited by the thickness of their substrate. To enhance the flexibility of semiconducting metal oxide-based electronic devices, a new and simple way to fabricate indium-gallium-zinc oxide (IGZO)-based electronic devices on an ultrathin (1.9 μm) poly(methyl methacrylate) (PMMA) substrate is introduced. The PMMA layer spin-coated on an unmodified glass slide has no chemical interactions at the interface, resulting in weak adhesion. Therefore, the PMMA layer with the devices is readily peeled off the underlying glass slide without using any sacrificial layer. Thin film transistors (TFTs) and gas sensors are fabricated on a 1.9 μm thick PMMA substrate. The fabricated bottom-gated IGZO TFTs exhibits excellent transistor performances with a mobility of 10.7 cm V s, a threshold voltage of 8.4 V and an on/off current ratio of 5 × 10. The PMMA substrate having palladium (Pd)-decorated IGZO H sensors is attached to the nonplanar substrates such as wrinkled hand glove and poly(vinyl chloride) (PVC) gas tubes, and the sensors demonstrate an excellent sensitivity of ≈10% at 5% H concentration at room temperature. Furthermore, both electronic devices show superior flexibility without any performance degradation even at a bending radius down to <1 mm.Citation
Kumaresan Y, Lee R, Lim N, Pak Y, Kim H, et al. (2018) Extremely Flexible Indium-Gallium-Zinc Oxide (IGZO) Based Electronic Devices Placed on an Ultrathin Poly(Methyl Methacrylate) (PMMA) Substrate. Advanced Electronic Materials 4: 1800167. Available: http://dx.doi.org/10.1002/aelm.201800167.Sponsors
This work was supported by the Pioneer Research Center Program (No. NRF-2016M3C1A3908893) and by the Basic Science Research Program (No. NRF-2016R1A2B4006395) through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT. The research was partially supported by the GIST Research Institute (GRI) project through a grant provided by GIST in 2018.Publisher
WileyJournal
Advanced Electronic MaterialsAdditional Links
https://onlinelibrary.wiley.com/doi/full/10.1002/aelm.201800167ae974a485f413a2113503eed53cd6c53
10.1002/aelm.201800167