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dc.contributor.authorChoi, Hyun Ho
dc.contributor.authorRodionov, Yaroslav I.
dc.contributor.authorPaterson, Alexandra
dc.contributor.authorPanidi, Julianna
dc.contributor.authorSaranin, Danila
dc.contributor.authorKharlamov, Nikolai
dc.contributor.authorDidenko, Sergei I.
dc.contributor.authorAnthopoulos, Thomas D.
dc.contributor.authorCho, Kilwon
dc.contributor.authorPodzorov, Vitaly
dc.date.accessioned2018-05-07T07:22:19Z
dc.date.available2018-05-07T07:22:19Z
dc.date.issued2018-04-30
dc.identifier.citationChoi HH, Rodionov YI, Paterson AF, Panidi J, Saranin D, et al. (2018) Accurate Extraction of Charge Carrier Mobility in 4-Probe Field-Effect Transistors. Advanced Functional Materials: 1707105. Available: http://dx.doi.org/10.1002/adfm.201707105.
dc.identifier.issn1616-301X
dc.identifier.doi10.1002/adfm.201707105
dc.identifier.urihttp://hdl.handle.net/10754/627753
dc.description.abstractCharge carrier mobility is an important characteristic of organic field-effect transistors (OFETs) and other semiconductor devices. However, accurate mobility determination in FETs is frequently compromised by issues related to Schottky-barrier contact resistance, that can be efficiently addressed by measurements in 4-probe/Hall-bar contact geometry. Here, it is shown that this technique, widely used in materials science, can still lead to significant mobility overestimation due to longitudinal channel shunting caused by voltage probes in 4-probe structures. This effect is investigated numerically and experimentally in specially designed multiterminal OFETs based on optimized novel organic-semiconductor blends and bulk single crystals. Numerical simulations reveal that 4-probe FETs with long but narrow channels and wide voltage probes are especially prone to channel shunting, that can lead to mobilities overestimated by as much as 350%. In addition, the first Hall effect measurements in blended OFETs are reported and how Hall mobility can be affected by channel shunting is shown. As a solution to this problem, a numerical correction factor is introduced that can be used to obtain much more accurate experimental mobilities. This methodology is relevant to characterization of a variety of materials, including organic semiconductors, inorganic oxides, monolayer materials, as well as carbon nanotube and semiconductor nanocrystal arrays.
dc.description.sponsorshipThe authors are grateful to the following programs for the financial support of this work: the National Science Foundation under the grant DMR-1506609, the Rutgers Energy Institute (REI), the Center for Advanced Soft-Electronics funded by the Ministry of Science, ICT and Future Planning as Global Frontier Project (CASE-2011-0031628), and the Ministry of Education and Science of the Russian Federation in the framework of Increase Competitiveness Program of NUST «MISiS» (№ K3-2016-004), implemented by a governmental decree dated 16th of March 2013, N 211. T.D.A., and A.F.P, acknowledge the King Abdullah University of Science and Technology (KAUST) for financial support.
dc.publisherWiley
dc.relation.urlhttps://onlinelibrary.wiley.com/doi/full/10.1002/adfm.201707105
dc.rightsThis is the peer reviewed version of the following article: Accurate Extraction of Charge Carrier Mobility in 4-Probe Field-Effect Transistors, which has been published in final form at https://doi.org/10.1002/adfm.201707105. This article may be used for non-commercial purposes in accordance With Wiley Terms and Conditions for self-archiving.
dc.subjectConjugated polymers
dc.subjectField-effect transistors
dc.subjectMobility
dc.subjectMolecular crystals
dc.subjectOrganic semiconductors
dc.titleAccurate Extraction of Charge Carrier Mobility in 4-Probe Field-Effect Transistors
dc.typeArticle
dc.contributor.departmentKAUST Solar Center (KSC)
dc.contributor.departmentMaterial Science and Engineering Program
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalAdvanced Functional Materials
dc.eprint.versionPost-print
dc.contributor.institutionDepartment of Chemical Engineering and Center for Advanced Soft Electronics Pohang University of Science and Technology (POSTECH) Pohang 37673 South Korea
dc.contributor.institutionDepartment of Physics Rutgers University Piscataway 08854NJ USA
dc.contributor.institutionInstitute for Theoretical and Applied Electrodynamics RAS Moscow 125412 Russia
dc.contributor.institutionDepartment of Semiconductor Electronics and Semiconductor Physics National University of Science and Technology MISiS Moscow 119049 Russia
dc.contributor.institutionDepartment of Physics and Centre for Plastic Electronics Imperial College London South Kensington London SW7 2AZ UK
kaust.personPaterson, Alexandra
kaust.personAnthopoulos, Thomas D.
refterms.dateFOA2019-04-30T00:00:00Z
dc.date.published-online2018-04-30
dc.date.published-print2018-06


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