Measurement of the surface susceptibility and the surface conductivity of atomically thin MoS2 by spectroscopic ellipsometry
KAUST DepartmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Physical Sciences and Engineering (PSE) Division
Materials Science and Engineering Program
Permanent link to this recordhttp://hdl.handle.net/10754/627262
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AbstractWe show how to correctly extract from the ellipsometric data the surface susceptibility and the surface conductivity that describe the optical properties of monolayer MoS. Theoretically, these parameters stem from modelling a single-layer two-dimensional crystal as a surface current, a truly two-dimensional model. Current experimental practice is to consider this model equivalent to a homogeneous slab with an effective thickness given by the interlayer spacing of the exfoliating bulk material. We prove that the error in the evaluation of the surface susceptibility of monolayer MoS, owing to the use of the slab model, is at least 10% or greater, a significant discrepancy in the determination of the optical properties of this material.
CitationJayaswal G, Dai Z, Zhang X, Bagnarol M, Martucci A, et al. (2018) Measurement of the surface susceptibility and the surface conductivity of atomically thin MoS2 by spectroscopic ellipsometry. Optics Letters 43: 703. Available: http://dx.doi.org/10.1364/OL.43.000703.
SponsorsFunding: Università degli Studi di Padova (BIRD170839/17). Acknowledgment: M. M. gratefully acknowledges the support from Dipartimento di Fisica e Astronomia G. Galilei, Università Degli Studi di Padova. M. M. conceived the idea and wrote the Letter. G. J. and Z. D. prepared the sample under the supervision of X. Z. Measurements and data analysis were done by M. B., M. M., and A. M.
PublisherThe Optical Society