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dc.contributor.authorZhang, Daliang
dc.contributor.authorZhu, Yihan
dc.contributor.authorLiu, Lingmei
dc.contributor.authorYing, Xiangrong
dc.contributor.authorHsiung, Chia-En
dc.contributor.authorSougrat, Rachid
dc.contributor.authorLi, Kun
dc.contributor.authorHan, Yu
dc.date.accessioned2018-01-28T07:22:28Z
dc.date.available2018-01-28T07:22:28Z
dc.date.issued2018-01-18
dc.identifier.citationZhang D, Zhu Y, Liu L, Ying X, Hsiung C-E, et al. (2018) Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials. Science: eaao0865. Available: http://dx.doi.org/10.1126/science.aao0865.
dc.identifier.issn0036-8075
dc.identifier.issn1095-9203
dc.identifier.pmid29348363
dc.identifier.doi10.1126/science.aao0865
dc.identifier.urihttp://hdl.handle.net/10754/626889
dc.description.abstractHigh-resolution imaging of electron beam-sensitive materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with extremely low beam doses, the time-constrained search for crystal zone axes, the precise image alignment, and the accurate determination of the defocus value. We develop a suite of methods to fulfill these requirements and acquire atomic-resolution TEM images of several metal organic frameworks that are generally recognized as highly sensitive to electron beams. The high image resolution allows us to identify individual metal atomic columns, various types of surface termination, and benzene rings in the organic linkers. We also apply our methods to other electron beam–sensitive materials, including the organic-inorganic hybrid perovskite CH3NH3PbBr3.
dc.description.sponsorshipWe thank M. Pan and O. Terasaki for helpful discussions. This work was supported by King Abdullah University of Science and Technology through Competitive Research Grant (URF/1/2570-01) and Center Competitive Funding (FCC/1/1972-19). HRTEM images presented in this paper and the two programs used for zone axis alignment and image alignment are archived in a data repository (https://zenodo.org/record/1133206) for verification purposes only. Interested readers can download the programs after agreeing with the terms and conditions stated there. D. Z., Y. Z., K. L., and Y. H. are inventors on United States Provisional patent applications (62/490,967 and 62/490,968) submitted by King Abdullah University of Science and Technology that cover the methods for crystal zone axis alignment and image alignment.
dc.publisherAmerican Association for the Advancement of Science (AAAS)
dc.relation.urlhttp://science.sciencemag.org/content/early/2018/01/17/science.aao0865
dc.rightsArchived with thanks to Science
dc.titleAtomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials
dc.typeArticle
dc.contributor.departmentAdvanced Membranes and Porous Materials Research Center
dc.contributor.departmentBiological and Environmental Sciences and Engineering (BESE) Division
dc.contributor.departmentChemical Science Program
dc.contributor.departmentElectron Microscopy
dc.contributor.departmentImaging and Characterization Core Lab
dc.contributor.departmentKAUST Catalysis Center (KCC)
dc.contributor.departmentNanostructured Functional Materials (NFM) laboratory
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalScience
dc.eprint.versionPost-print
kaust.personZhang, Daliang
kaust.personZhu, Yihan
kaust.personLiu, Lingmei
kaust.personYing, Xiangrong
kaust.personHsiung, Chia-En
kaust.personSougrat, Rachid
kaust.personLi, Kun
kaust.personHan, Yu
kaust.grant.numberURF/1/2570-01
kaust.grant.numberFCC/1/1972-19
dc.date.published-online2018-01-18
dc.date.published-print2018-02-09


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