Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials
KAUST DepartmentAdvanced Membranes and Porous Materials Research Center
Physical Sciences and Engineering (PSE) Division
Biological and Environmental Sciences and Engineering (BESE) Division
Imaging and Characterization Core Lab
Chemical Science Program
KAUST Catalysis Center (KCC)
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AbstractHigh-resolution imaging of electron beam-sensitive materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with extremely low beam doses, the time-constrained search for crystal zone axes, the precise image alignment, and the accurate determination of the defocus value. We develop a suite of methods to fulfill these requirements and acquire atomic-resolution TEM images of several metal organic frameworks that are generally recognized as highly sensitive to electron beams. The high image resolution allows us to identify individual metal atomic columns, various types of surface termination, and benzene rings in the organic linkers. We also apply our methods to other electron beam–sensitive materials, including the organic-inorganic hybrid perovskite CH3NH3PbBr3.
CitationZhang D, Zhu Y, Liu L, Ying X, Hsiung C-E, et al. (2018) Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials. Science: eaao0865. Available: http://dx.doi.org/10.1126/science.aao0865.
SponsorsWe thank M. Pan and O. Terasaki for helpful discussions. This work was supported by King Abdullah University of Science and Technology through Competitive Research Grant (URF/1/2570-01) and Center Competitive Funding (FCC/1/1972-19). HRTEM images presented in this paper and the two programs used for zone axis alignment and image alignment are archived in a data repository (https://zenodo.org/record/1133206) for verification purposes only. Interested readers can download the programs after agreeing with the terms and conditions stated there. D. Z., Y. Z., K. L., and Y. H. are inventors on United States Provisional patent applications (62/490,967 and 62/490,968) submitted by King Abdullah University of Science and Technology that cover the methods for crystal zone axis alignment and image alignment.
CollectionsArticles; Advanced Membranes and Porous Materials Research Center; Advanced Nanofabrication, Imaging and Characterization Core Lab; Physical Sciences and Engineering (PSE) Division; Chemical Science Program; KAUST Catalysis Center (KCC); Biological and Environmental Sciences and Engineering (BESE) Division
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