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dc.contributor.authorGiugni, Andrea
dc.contributor.authorTorre, Bruno
dc.contributor.authorAllione, Marco
dc.contributor.authorPerozziello, Gerardo
dc.contributor.authorCandeloro, Patrizio
dc.contributor.authorDi Fabrizio, Enzo M.
dc.date.accessioned2017-11-21T09:05:29Z
dc.date.available2017-11-21T09:05:29Z
dc.date.issued2017-08-16
dc.identifier.citationGiugni, A., Torre, B., Allione, M., Perozziello, G., Candeloro, P. and Di Fabrizio, E. (2017) Hot Electron Nanoscopy and Spectroscopy (HENs), in Conductive Atomic Force Microscopy: Applications in Nanomaterials (ed M. Lanza), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527699773.ch15
dc.identifier.doi10.1002/9783527699773.ch15
dc.identifier.urihttp://hdl.handle.net/10754/626184
dc.description.abstractThis chapter includes a brief description of different laser coupling methods with guided surface plasmon polariton (SPP) modes at the surface of a cone. It shows some devices, their electromagnetic simulations, and their optical characterization. A theoretical section illustrates the optical and quantum description of the hot charge generation rate as obtained for the SPP propagation along the nanocone in adiabatic compression. The chapter also shows some experimental results concerning the application of the hot electron nanoscopy and spectroscopy (HENs) in the so-called Schottky configuration, highlighting the sensitivity and the nanoscale resolution of the technique. The comparison with Kelvin probe and other electric atomic force microscopy (AFM) techniques points out the intrinsic advantages of the HENs. In the end, some further insights are given about the possibility of exploiting HENs with a pulsed laser at the femtosecond time scale without significant pulse broadening and dispersion.
dc.language.isoen
dc.publisherWiley
dc.relation.urlhttp://onlinelibrary.wiley.com/doi/10.1002/9783527699773.ch15/summary
dc.rightsThis is the peer reviewed version of the following article: Giugni, A., Torre, B., Allione, M., Perozziello, G., Candeloro, P. and Di Fabrizio, E. (2017) Hot Electron Nanoscopy and Spectroscopy (HENs), in Conductive Atomic Force Microscopy: Applications in Nanomaterials (ed M. Lanza), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527699773.ch15, which has been published in final form at 10.1002/9783527699773.ch15. This article may be used for non-commercial purposes in accordance With Wiley Terms and Conditions for self-archiving.
dc.subjectadiabatic compression
dc.subjectcoupling schemes
dc.subjectelectrical techniques
dc.subjecthot electron generation
dc.subjecthot electron nanoscopy and spectroscopy
dc.subjectoptical characterization
dc.subjectplasmonic device
dc.subjectscanning Kelvin probe microscopy
dc.subjectultimate spatial resolution
dc.titleHot Electron Nanoscopy and Spectroscopy (HENs)
dc.typeBook Chapter
dc.contributor.departmentMaterial Science and Engineering Program
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalConductive Atomic Force Microscopy: Applications in Nanomaterials
dc.eprint.versionPost-print
dc.contributor.institutionDepartement of Experimental Clinics, Bionem Lab, University Magna Graecia, 88100 Germaneto-Catanzaro, Italy
dc.contributor.affiliationKing Abdullah University of Science and Technology (KAUST)
kaust.personGiugni, Andrea
kaust.personTorre, Bruno
kaust.personAllione, Marco
kaust.personDi Fabrizio, Enzo M.


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