Hot Electron Nanoscopy and Spectroscopy (HENs)
dc.contributor.author | Giugni, Andrea | |
dc.contributor.author | Torre, Bruno | |
dc.contributor.author | Allione, Marco | |
dc.contributor.author | Perozziello, Gerardo | |
dc.contributor.author | Candeloro, Patrizio | |
dc.contributor.author | Di Fabrizio, Enzo M. | |
dc.date.accessioned | 2017-11-21T09:05:29Z | |
dc.date.available | 2017-11-21T09:05:29Z | |
dc.date.issued | 2017-08-16 | |
dc.identifier.citation | Giugni, A., Torre, B., Allione, M., Perozziello, G., Candeloro, P. and Di Fabrizio, E. (2017) Hot Electron Nanoscopy and Spectroscopy (HENs), in Conductive Atomic Force Microscopy: Applications in Nanomaterials (ed M. Lanza), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527699773.ch15 | |
dc.identifier.doi | 10.1002/9783527699773.ch15 | |
dc.identifier.uri | http://hdl.handle.net/10754/626184 | |
dc.description.abstract | This chapter includes a brief description of different laser coupling methods with guided surface plasmon polariton (SPP) modes at the surface of a cone. It shows some devices, their electromagnetic simulations, and their optical characterization. A theoretical section illustrates the optical and quantum description of the hot charge generation rate as obtained for the SPP propagation along the nanocone in adiabatic compression. The chapter also shows some experimental results concerning the application of the hot electron nanoscopy and spectroscopy (HENs) in the so-called Schottky configuration, highlighting the sensitivity and the nanoscale resolution of the technique. The comparison with Kelvin probe and other electric atomic force microscopy (AFM) techniques points out the intrinsic advantages of the HENs. In the end, some further insights are given about the possibility of exploiting HENs with a pulsed laser at the femtosecond time scale without significant pulse broadening and dispersion. | |
dc.language.iso | en | |
dc.publisher | Wiley | |
dc.relation.url | http://onlinelibrary.wiley.com/doi/10.1002/9783527699773.ch15/summary | |
dc.rights | This is the peer reviewed version of the following article: Giugni, A., Torre, B., Allione, M., Perozziello, G., Candeloro, P. and Di Fabrizio, E. (2017) Hot Electron Nanoscopy and Spectroscopy (HENs), in Conductive Atomic Force Microscopy: Applications in Nanomaterials (ed M. Lanza), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527699773.ch15, which has been published in final form at 10.1002/9783527699773.ch15. This article may be used for non-commercial purposes in accordance With Wiley Terms and Conditions for self-archiving. | |
dc.subject | adiabatic compression | |
dc.subject | coupling schemes | |
dc.subject | electrical techniques | |
dc.subject | hot electron generation | |
dc.subject | hot electron nanoscopy and spectroscopy | |
dc.subject | optical characterization | |
dc.subject | plasmonic device | |
dc.subject | scanning Kelvin probe microscopy | |
dc.subject | ultimate spatial resolution | |
dc.title | Hot Electron Nanoscopy and Spectroscopy (HENs) | |
dc.type | Book Chapter | |
dc.contributor.department | Material Science and Engineering Program | |
dc.contributor.department | Physical Science and Engineering (PSE) Division | |
dc.identifier.journal | Conductive Atomic Force Microscopy: Applications in Nanomaterials | |
dc.eprint.version | Post-print | |
dc.contributor.institution | Departement of Experimental Clinics, Bionem Lab, University Magna Graecia, 88100 Germaneto-Catanzaro, Italy | |
dc.contributor.affiliation | King Abdullah University of Science and Technology (KAUST) | |
kaust.person | Giugni, Andrea | |
kaust.person | Torre, Bruno | |
kaust.person | Allione, Marco | |
kaust.person | Di Fabrizio, Enzo M. | |
refterms.dateFOA | 2018-08-16T00:00:00Z |
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