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dc.contributor.authorLopatin, Sergei
dc.contributor.authorCheng, Bin
dc.contributor.authorLiu, Wei-Ting
dc.contributor.authorTsai, Meng-Lin
dc.contributor.authorHe, Jr-Hau
dc.contributor.authorChuvilin, Andrey
dc.date.accessioned2017-10-03T12:49:37Z
dc.date.available2017-10-03T12:49:37Z
dc.date.issued2017-09-01
dc.identifier.citationLopatin S, Cheng B, Liu W-T, Tsai M-L, He J-H, et al. (2018) Optimization of monochromated TEM for ultimate resolution imaging and ultrahigh resolution electron energy loss spectroscopy. Ultramicroscopy 184: 109–115. Available: http://dx.doi.org/10.1016/j.ultramic.2017.08.016.
dc.identifier.issn0304-3991
dc.identifier.pmid28886488
dc.identifier.doi10.1016/j.ultramic.2017.08.016
dc.identifier.urihttp://hdl.handle.net/10754/625753
dc.description.abstractThe performance of a monochromated transmission electron microscope with Wien type monochromator is optimized to achieve an extremely narrow energy spread of electron beam and an ultrahigh energy resolution with spectroscopy. The energy spread in the beam is improved by almost an order of magnitude as compared to specified values. The optimization involves both the monochromator and the electron energy loss detection system. We demonstrate boosted capability of optimized systems with respect to ultra-low loss EELS and sub-angstrom resolution imaging (in a combination with spherical aberration correction).
dc.description.sponsorshipAuthors would like to thank Dr. Peter C Tiemeijer from FEI Co for fruitful comments and discussions regarding the monochromator operation and optimization. Also we would like to acknowledge Dmitry Melnikau for providing a sample of Ag nanowires.
dc.publisherElsevier BV
dc.relation.urlhttp://www.sciencedirect.com/science/article/pii/S0304399117302073
dc.rightsNOTICE: this is the author’s version of a work that was accepted for publication in Ultramicroscopy. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Ultramicroscopy, [, , (2017-09-01)] DOI: 10.1016/j.ultramic.2017.08.016 . © 2017. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectBandgap
dc.subjectEELS
dc.subjectPhonons
dc.subjectPlasmons
dc.subjectSub-angstrom resolution
dc.subjectUltra-low energy loss
dc.titleOptimization of Monochromated TEM for Ultimate Resolution Imaging and Ultrahigh Resolution Electron Energy Loss Spectroscopy
dc.typeArticle
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentElectrical Engineering Program
dc.contributor.departmentElectron Microscopy
dc.contributor.departmentImaging and Characterization Core Lab
dc.contributor.departmentKAUST Solar Center (KSC)
dc.identifier.journalUltramicroscopy
dc.eprint.versionPost-print
dc.contributor.institutionDepartment of Materials Science and Engineering, National Tsing Hua University, Hsinchu, , Taiwan
dc.contributor.institutionIKERBASQUE, Basque Foundation for Science, Bilbao, , Spain
dc.contributor.institutionCIC nanoGUNE Consolider, San Sebastian, Spain
kaust.personLopatin, Sergei
kaust.personCheng, Bin
kaust.personLiu, Wei-Ting
kaust.personHe, Jr-Hau
dc.date.published-online2017-09-01
dc.date.published-print2018-01


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