Angular Magnetoresistance of Nanowires with Alternating Cobalt and Nickel Segments
Type
ArticleAuthors
Mohammed, Hanan
Corte-Leon, H.
Ivanov, Yurii P.

Moreno Garcia, Julian

Kazakova, O.
Kosel, Jürgen

KAUST Department
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) DivisionElectrical Engineering Program
Materials Science and Engineering Program
Date
2017-06-22Permanent link to this record
http://hdl.handle.net/10754/625529
Metadata
Show full item recordAbstract
Magnetization reversal in segmented Co/Ni nanowires with varying number of segments was studied using angular Magnetoresistance (MR) measurements on isolated nanowires. The MR measurements offer an insight into the pinning of domain walls within the nanowires. Angular MR measurements were performed on nanowires with two and multiple segments by varying the angle between the applied magnetic field and nanowire (−90° ≤θ≤90°). The angular MR measurements reveal that at lower values of θ the switching fields are nearly identical for the multisegmented and two-segmented nanowires, whereas at higher values of θ, a decrease in the switching field is observed in the case of two segmented nanowires. The two segmented nanowires generally exhibit a single domain wall pinning event, whereas an increased number of pinning events are characteristic of the multisegmented nanowires at higher values of θ. In-situ magnetic force microscopy substantiates reversal by domain wall nucleation and propagation in multisegmented nanowires.Citation
Mohammed H, Corte-Leon H, Ivanov YP, Moreno JA, Kazakova O, et al. (2017) Angular Magnetoresistance of Nanowires with Alternating Cobalt and Nickel Segments. IEEE Transactions on Magnetics: 1–1. Available: http://dx.doi.org/10.1109/TMAG.2017.2718623.Sponsors
This work was funded partly by King Abdullah University of Science and Technology and in part by EMRP and EMRP participating countries under Project EXL04 (SpinCal), and FP7 project NanoMag, and NanoMag (EMPIR).Journal
IEEE Transactions on MagneticsAdditional Links
http://ieeexplore.ieee.org/document/7954991/ae974a485f413a2113503eed53cd6c53
10.1109/TMAG.2017.2718623