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dc.contributor.authorHao, Qi
dc.contributor.authorStovas, Alexey
dc.date.accessioned2017-10-01T05:07:26Z
dc.date.available2017-10-01T05:07:26Z
dc.date.issued2017-09-18
dc.identifier.citationHao Q, Stovas A (2017) Approximate reflection coefficients for a thin VTI layer. GEOPHYSICS: 1–61. Available: http://dx.doi.org/10.1190/geo2016-0638.1.
dc.identifier.issn0016-8033
dc.identifier.issn1942-2156
dc.identifier.doi10.1190/geo2016-0638.1
dc.identifier.urihttp://hdl.handle.net/10754/625511
dc.description.abstractWe present an approximate method to derive simple expressions for the reflection coefficients of P- and SV-waves for a thin transversely isotropic layer with a vertical symmetry axis (VTI) embedded in a homogeneous VTI background. The layer thickness is assumed to be much smaller than the wavelengths of P- and SV-waves inside. The exact reflection and transmission coefficients are derived by the propagator matrix method. In the case of normal incidence, the exact reflection and transmission coefficients are expressed in terms of the impedances of vertically propagating P- and S-waves. For subcritical incidence, the approximate reflection coefficients are expressed in terms of the contrast in the VTI parameters between the layer and the background. Numerical examples are designed to analyze the reflection coefficients at normal and oblique incidence, and investigate the influence of transverse isotropy on the reflection coefficients. Despite giving numerical errors, the approximate formulae are sufficiently simple to qualitatively analyze the variation of the reflection coefficients with the angle of incidence.
dc.description.sponsorshipWe thank rock and seismic (ROSE) project for support. The first author thanks V. Li, J. Cheng and an anonymous reviewer for their critical reviews, and especially thanks guest associate editor I. Tsvankin for his constructive review, many valuable suggestions and improving the English of the paper.
dc.publisherSociety of Exploration Geophysicists
dc.relation.urlhttp://library.seg.org/doi/10.1190/geo2016-0638.1
dc.rightsArchived with thanks to GEOPHYSICS
dc.titleApproximate reflection coefficients for a thin VTI layer
dc.typeArticle
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalGEOPHYSICS
dc.eprint.versionPost-print
dc.contributor.institutionNorwegian University of Science and Technology (NTNU)
kaust.personHao, Qi
refterms.dateFOA2018-06-13T14:45:09Z


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