New Closed-Form Results on Ordered Statistics of Partial Sums of Gamma Random Variables and its Application to Performance Evaluation in the Presence of Nakagami Fading

Abstract
Complex wireless transmission systems require multi-dimensional joint statistical techniques for performance evaluation. Here, we first present the exact closed-form results on order statistics of any arbitrary partial sums of Gamma random variables with the closedform results of core functions specialized for independent and identically distributed Nakagami-m fading channels based on a moment generating function-based unified analytical framework. These both exact closed-form results have never been published in the literature. In addition, as a feasible application example in which our new offered derived closed-form results can be applied is presented. In particular, we analyze the outage performance of the finger replacement schemes over Nakagami fading channels as an application of our method. Note that these analysis results are directly applicable to several applications, such as millimeter-wave communication systems in which an antenna diversity scheme operates using an finger replacement schemes-like combining scheme, and other fading scenarios. Note also that the statistical results can provide potential solutions for ordered statistics in any other research topics based on Gamma distributions or other advanced wireless communications research topics in the presence of Nakagami fading.

Citation
Nam SS, Ko Y-C, Alouini M-S (2017) New Closed-Form Results on Ordered Statistics of Partial Sums of Gamma Random Variables and its Application to Performance Evaluation in the Presence of Nakagami Fading. IEEE Access: 1–1. Available: http://dx.doi.org/10.1109/ACCESS.2017.2717048.

Acknowledgements
This work was supported by Institute for Information & communications Technology Promotion(IITP) grant funded by the Korea government(MSIP) (No. 2014-00552, Next Generation WLAN System with High Efficient Performance).

Publisher
Institute of Electrical and Electronics Engineers (IEEE)

Journal
IEEE Access

DOI
10.1109/ACCESS.2017.2717048

Additional Links
http://ieeexplore.ieee.org/document/7953495/

Permanent link to this record