A single nano cantilever as a reprogrammable universal logic gate
AuthorsChappanda, K. N.
Holguin Lerma, Jorge Alberto
Batra, Nitin M
Da Costa, Pedro M. F. J.
Younis, Mohammad I.
KAUST DepartmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Electrical Engineering Program
Material Science and Engineering Program
Mechanical Engineering Program
Physical Science and Engineering (PSE) Division
Online Publication Date2017-02-24
Print Publication Date2017-04-01
Permanent link to this recordhttp://hdl.handle.net/10754/623785
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AbstractThe current transistor-based computing circuits use multiple interconnected transistors to realize a single Boolean logic gate. This leads to higher power requirements and delayed computing. Transistors are not suitable for applications in harsh environments and require complicated thermal management systems due to excessive heat dissipation. Also, transistor circuits lack the ability to dynamically reconfigure their functionality in real time, which is desirable for enhanced computing capability. Further, the miniaturization of transistors to improve computational power is reaching its ultimate physical limits. As a step towards overcoming the limitations of transistor-based computing, here we demonstrate a reprogrammable universal Boolean logic gate based on a nanoelectromechanical cantilever (NC) oscillator. The fundamental XOR, AND, NOR, OR and NOT logic gates are condensed in a single NC, thereby reducing electrical interconnects between devices. The device is dynamically switchable between any logic gates at the same drive frequency without the need for any change in the circuit. It is demonstrated to operate at elevated temperatures minimizing the need for thermal management systems. It has a tunable bandwidth of 5 MHz enabling parallel and dynamically reconfigurable logic device for enhanced computing.
CitationChappanda KN, Ilyas S, Kazmi SNR, Holguin-Lerma J, Batra NM, et al. (2017) A single nano cantilever as a reprogrammable universal logic gate. Journal of Micromechanics and Microengineering 27: 045007. Available: http://dx.doi.org/10.1088/1361-6439/aa5dfa.
SponsorsThe work presented here was supported by funding from King Abdullah University of Science and Technology (KAUST). The authors acknowledge the staff of the Advanced Nanofabrication Imaging and Characterization lab at KAUST for the help with the device fabrication