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dc.contributor.authorAl Attar, Talal
dc.contributor.authorAlshehri, Abdullah
dc.contributor.authorAlmansouri, Abdullah Saud Mohammed
dc.contributor.authorAl-Turki, Abdullah Turki
dc.date.accessioned2017-05-22T06:58:03Z
dc.date.available2017-05-22T06:58:03Z
dc.date.issued2017-05-13
dc.identifier.citationAl-Attar T, Alshehri A, Almansouri A, Alturki A (2017) Critical parameters affecting the design of high frequency transmission lines in standard CMOS technology. 2017 International Applied Computational Electromagnetics Society Symposium - Italy (ACES). Available: http://dx.doi.org/10.23919/ROPACES.2017.7916053.
dc.identifier.doi10.23919/ROPACES.2017.7916053
dc.identifier.urihttp://hdl.handle.net/10754/623676
dc.description.abstractDifferent structures of transmission lines were designed and fabricated in standard CMOS technology to estimate some critical parameters including the RMS value of the surface roughness and the loss tangent. The input impedances for frequencies up to 50 GHz were modeled and compared with measurements. The results demonstrated a strong correlation between the used model with the proposed coefficients and the measured results, attesting the robustness of the model and the reliability of the incorporated coefficients values.
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.urlhttp://ieeexplore.ieee.org/document/7916053/
dc.rightsArchived with thanks to Applied Computational Electromagnetics Society Symposium - Italy (ACES), 2017 International
dc.subjectCoplanar waveguides
dc.subjectMathematical model
dc.subjectPropagation losses
dc.subjectRough surfaces
dc.subjectSurface impedance
dc.subjectSurface roughness
dc.subjectTransmission line measurements
dc.titleCritical parameters affecting the design of high frequency transmission lines in standard CMOS technology
dc.typeConference Paper
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentElectrical Engineering Program
dc.identifier.journal2017 International Applied Computational Electromagnetics Society Symposium - Italy (ACES)
dc.eprint.versionPublisher's Version/PDF
kaust.personAl Attar, Talal
kaust.personAlshehri, Abdullah
kaust.personAlmansouri, Abdullah Saud Mohammed
kaust.personAl-Turki, Abdullah Turki
refterms.dateFOA2018-06-13T17:25:11Z
dc.date.published-online2017-05-13
dc.date.published-print2017-03


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