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dc.contributor.authorIvanov, Yurii P.
dc.contributor.authorChuvilin, Andrey
dc.contributor.authorLopatin, Sergei
dc.contributor.authorMohammed, Hanan
dc.contributor.authorKosel, Jürgen
dc.date.accessioned2017-05-17T07:41:39Z
dc.date.available2017-05-17T07:41:39Z
dc.date.issued2017-05-15
dc.identifier.citationIvanov YP, Chuvilin A, Lopatin S, Mohammed H, Kosel J (2017) Direct Observation of Current-Induced Motion of a 3D Vortex Domain Wall in Cylindrical Nanowires. ACS Applied Materials & Interfaces. Available: http://dx.doi.org/10.1021/acsami.7b03404.
dc.identifier.issn1944-8244
dc.identifier.issn1944-8252
dc.identifier.pmid28481499
dc.identifier.doi10.1021/acsami.7b03404
dc.identifier.urihttp://hdl.handle.net/10754/623631
dc.description.abstractThe current-induced dynamics of 3D magnetic vortex domain walls in cylindrical Co/Ni nanowires are revealed experimentally using Lorentz microscopy and theoretically using micromagnetic simulations. We demonstrate that a spin-polarized electric current can control the reversible motion of 3D vortex domain walls, which travel with a velocity of a few hundred meters per second. This finding is a key step in establishing fast, high-density memory devices based on vertical arrays of cylindrical magnetic nanowires.
dc.description.sponsorshipResearch reported in this publication was supported by the King Abdullah University of Science and Technology (KAUST).
dc.publisherAmerican Chemical Society (ACS)
dc.relation.urlhttp://pubs.acs.org/doi/abs/10.1021/acsami.7b03404
dc.rightsThis document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Applied Materials & Interfaces, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see http://pubs.acs.org/doi/abs/10.1021/acsami.7b03404.
dc.titleDirect observation of current-induced motion of a 3D vortex domain wall in cylindrical nanowires
dc.typeArticle
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentElectrical Engineering Program
dc.contributor.departmentElectron Microscopy
dc.identifier.journalACS Applied Materials & Interfaces
dc.eprint.versionPost-print
dc.contributor.institutionErich Schmid Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, A-8700, Leoben, Austria
dc.contributor.institutionSchool of Natural Sciences, Far Eastern Federal University, 690950, Vladivostok, Russia
dc.contributor.institutionIKERBASQUE, Basque Foundation for Science, Maria Diaz de Haro 3, 48013, Bilbao, Spain
kaust.personIvanov, Yurii P.
kaust.personLopatin, Sergei
kaust.personMohammed, Hanan
kaust.personKosel, Jürgen
refterms.dateFOA2018-05-08T00:00:00Z
dc.date.published-online2017-05-15
dc.date.published-print2017-05-24


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