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dc.contributor.authorFalqui, Andrea
dc.contributor.authorCasu, Alberto
dc.contributor.authorGenovese, Alessandro
dc.contributor.authorManna, Liberato
dc.contributor.authorLongo, Paolo
dc.contributor.authorBotton, Gianluigi A.
dc.contributor.authorLazar, Sorin
dc.contributor.authorUpadhyayKahaly, Mousumi
dc.contributor.authorSchwingenschlögl, Udo
dc.date.accessioned2017-04-15T11:15:46Z
dc.date.available2017-04-15T11:15:46Z
dc.date.issued2015-09-23
dc.identifier.citationFalqui A, Casu A, Genovese A, Manna L, Longo P, et al. (2015) Thermally Driven Cation Exchange at Solid State between Cu2Se and CdSe Nanocrystals: an In-Situ TEM Study. Microscopy and Microanalysis 21: 947–948. Available: http://dx.doi.org/10.1017/s143192761500553x.
dc.identifier.issn1431-9276
dc.identifier.issn1435-8115
dc.identifier.doi10.1017/s143192761500553x
dc.identifier.urihttp://hdl.handle.net/10754/623240
dc.publisherCambridge University Press (CUP)
dc.relation.urlhttps://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/div-classtitlethermally-driven-cation-exchange-at-solid-state-between-cuspan-classsub2spanse-and-cdse-nanocrystals-an-span-classitalicin-situspan-tem-studydiv/88BC7B0D838FD779E2CFFC9E72994EA9
dc.titleThermally Driven Cation Exchange at Solid State between Cu2Se and CdSe Nanocrystals: an In-Situ TEM Study
dc.typeArticle
dc.contributor.departmentBiological and Environmental Sciences and Engineering (BESE) Division
dc.contributor.departmentBioscience Program
dc.contributor.departmentComputational Physics and Materials Science (CPMS)
dc.contributor.departmentMaterial Science and Engineering Program
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalMicroscopy and Microanalysis
dc.contributor.institutionIstituto Italiano di Tecnologia, via Morego 30, 16163 Genova, Italy
dc.contributor.institutionGatan, Inc., 5794 W Las Positas BLVD, Pleasanton, California, United States of America
dc.contributor.institutionDepartment of Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada
dc.contributor.institutionEI Electron Optics, Achtseweg Noord 5, Eindhoven, 5600 KA, Netherlands
kaust.personFalqui, Andrea
kaust.personGenovese, Alessandro
kaust.personUpadhyayKahaly, Mousumi
kaust.personSchwingenschlögl, Udo
dc.date.published-online2015-09-23
dc.date.published-print2015-08


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