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dc.contributor.authorSachan, R.
dc.contributor.authorRoldan, M. A.
dc.contributor.authorJin, D.
dc.contributor.authorWeber, W. J.
dc.contributor.authorFang, N. X.
dc.date.accessioned2017-04-15T11:15:46Z
dc.date.available2017-04-15T11:15:46Z
dc.date.issued2016-07-25
dc.identifier.citationSachan R, Roldan MA, Jin D, Weber WJ, Fang NX (2016) STEM-EELS Study of Plasmonic Modes in Ag nanotriangles: Size and Dielectric Dependence. Microscopy and Microanalysis 22: 988–989. Available: http://dx.doi.org/10.1017/s143192761600578x.
dc.identifier.issn1431-9276
dc.identifier.issn1435-8115
dc.identifier.doi10.1017/s143192761600578x
dc.identifier.urihttp://hdl.handle.net/10754/623237
dc.publisherCambridge University Press (CUP)
dc.relation.urlhttps://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/div-classtitlestem-eels-study-of-plasmonic-modes-in-ag-nanotriangles-size-and-dielectric-dependencediv/1CB519ABB7284443B9667FC596DDB2CE
dc.titleSTEM-EELS Study of Plasmonic Modes in Ag nanotriangles: Size and Dielectric Dependence
dc.typeArticle
dc.contributor.departmentImaging and Characterization Core Lab
dc.identifier.journalMicroscopy and Microanalysis
dc.contributor.institutionMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge TN 37831, USA
dc.contributor.institutionDepartment of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge MA 02139, USA
dc.contributor.institutionDepartment of Materials Science and Engineering, University of Tennessee, Knoxville TN 37996, USA
kaust.personRoldan, M. A.
dc.date.published-online2016-07-25
dc.date.published-print2016-07


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