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dc.contributor.authorLi, Ping
dc.contributor.authorDong, Yilin
dc.contributor.authorTang, Min
dc.contributor.authorMao, Junfa
dc.contributor.authorJiang, Li Jun
dc.contributor.authorBagci, Hakan
dc.date.accessioned2017-04-13T11:51:01Z
dc.date.available2017-04-13T11:51:01Z
dc.date.issued2017-03-11
dc.identifier.citationLi P, Dong Y, Tang M, Mao J, Jiang LJ, et al. (2017) Transient Thermal Analysis of 3-D Integrated Circuits Packages by the DGTD Method. IEEE Transactions on Components, Packaging and Manufacturing Technology: 1–10. Available: http://dx.doi.org/10.1109/TCPMT.2017.2666259.
dc.identifier.issn2156-3950
dc.identifier.issn2156-3985
dc.identifier.doi10.1109/TCPMT.2017.2666259
dc.identifier.urihttp://hdl.handle.net/10754/623216
dc.description.abstractSince accurate thermal analysis plays a critical role in the thermal design and management of the 3-D system-level integration, in this paper, a discontinuous Galerkin time-domain (DGTD) algorithm is proposed to achieve this purpose. Such as the parabolic partial differential equation (PDE), the transient thermal equation cannot be directly solved by the DGTD method. To address this issue, the heat flux, as an auxiliary variable, is introduced to reduce the Laplace operator to a divergence operator. The resulting PDE is hyperbolic, which can be further written into a conservative form. By properly choosing the definition of the numerical flux used for the information exchange between neighboring elements, the hyperbolic thermal PDE can be solved by the DGTD together with the auxiliary differential equation. The proposed algorithm is a kind of element-level domain decomposition method, which is suitable to deal with multiscale geometries in 3-D integrated systems. To verify the accuracy and robustness of the developed DGTD algorithm, several representative examples are benchmarked.
dc.description.sponsorshipThis work was supported in part by the National Science Foundation of China under Grant 61234001 and Grant 61674105 and in part by the University Grants Council of Hong Kong under Contract AoE/P-04/08. Recommended for publication by Associate Editor
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.urlhttp://ieeexplore.ieee.org/document/7875407/
dc.subjecttransient thermal analysis
dc.subjectAuxiliary-differential equation (ADE) method
dc.subjectdiscontinuous Galerkin time-domain (DGTD) method
dc.subjectintegrated circuit package
dc.subjectnumerical flux
dc.titleTransient Thermal Analysis of 3-D Integrated Circuits Packages by the DGTD Method
dc.typeArticle
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentElectrical Engineering Program
dc.contributor.departmentDepartment of Electronic Engineering, King Abdullah University of Science and Technology, Thuwal 23955, Saudi Arabia.
dc.identifier.journalIEEE Transactions on Components, Packaging and Manufacturing Technology
dc.contributor.institutionDepartment of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47906 USA.
dc.contributor.institutionDepartment of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong.
dc.contributor.institutionDepartment of Electronic Engineering, Shanghai Jiao Tong University, Shanghai 200240, China.
kaust.personBagci, Hakan
dc.date.published-online2017-03-11
dc.date.published-print2017-06


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