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Multiple inhomogeneity phantom imaging with a LabVIEW-based Electrical Impedance Tomography (LV-EIT) System

dc.contributor.authorBera, Tushar Kanti
dc.contributor.authorBera, Sampa
dc.contributor.authorNagaraju, J
dc.contributor.authorChakraborty, Badal
dc.date.accessioned2017-04-13T11:51:00Z
dc.date.available2017-04-13T11:51:00Z
dc.date.issued2017-03-02
dc.identifier.citationBera T, Bera S, Nagaraju J, Chakraborty B (2017) Multiple inhomogeneity phantom imaging with a LabVIEW-based Electrical Impedance Tomography (LV-EIT) System. Computer, Communication and Electrical Technology: 273–277. Available: http://dx.doi.org/10.1201/9781315400624-53.
dc.identifier.doi10.1201/9781315400624-53
dc.identifier.urihttp://hdl.handle.net/10754/623201
dc.publisherInforma UK Limited
dc.relation.urlhttp://www.crcnetbase.com/doi/10.1201/9781315400624-53
dc.titleMultiple inhomogeneity phantom imaging with a LabVIEW-based Electrical Impedance Tomography (LV-EIT) System
dc.typeBook Chapter
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalComputer, Communication and Electrical Technology
dc.contributor.institutionIndian Institute of Science (IISc), Bangalore, India
dc.contributor.institutionFaculty of Agricultural Engineering, Bidhan Chandra Krishi Viswavidyalaya, Mohanpur, West Bengal, India
kaust.personBera, Tushar Kanti
dc.date.published-online2017-03-02
dc.date.published-print2017-03-06


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