Solution-processed p-type copper(I) thiocyanate (CuSCN) for low-voltage flexible thin-film transistors and integrated inverter circuits
dc.contributor.author | Petti, Luisa | |
dc.contributor.author | Pattanasattayavong, Pichaya | |
dc.contributor.author | Lin, Yen-Hung | |
dc.contributor.author | Münzenrieder, Niko | |
dc.contributor.author | Cantarella, Giuseppe | |
dc.contributor.author | Yaacobi-Gross, Nir | |
dc.contributor.author | Yan, Feng | |
dc.contributor.author | Tröster, Gerhard | |
dc.contributor.author | Anthopoulos, Thomas D. | |
dc.date.accessioned | 2017-04-10T07:49:51Z | |
dc.date.available | 2017-04-10T07:49:51Z | |
dc.date.issued | 2017-03-17 | |
dc.identifier.citation | Petti L, Pattanasattayavong P, Lin Y-H, Münzenrieder N, Cantarella G, et al. (2017) Solution-processed p-type copper(I) thiocyanate (CuSCN) for low-voltage flexible thin-film transistors and integrated inverter circuits. Applied Physics Letters 110: 113504. Available: http://dx.doi.org/10.1063/1.4978531. | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.issn | 1077-3118 | |
dc.identifier.doi | 10.1063/1.4978531 | |
dc.identifier.uri | http://hdl.handle.net/10754/623105 | |
dc.description.abstract | We report on low operating voltage thin-film transistors (TFTs) and integrated inverters based on copper(I) thiocyanate (CuSCN) layers processed from solution at low temperature on free-standing plastic foils. As-fabricated coplanar bottom-gate and staggered top-gate TFTs exhibit hole-transporting characteristics with average mobility values of 0.0016 cm2 V−1 s−1 and 0.013 cm2 V−1 s−1, respectively, current on/off ratio in the range 102–104, and maximum operating voltages between −3.5 and −10 V, depending on the gate dielectric employed. The promising TFT characteristics enable fabrication of unipolar NOT gates on flexible free-standing plastic substrates with voltage gain of 3.4 at voltages as low as −3.5 V. Importantly, discrete CuSCN transistors and integrated logic inverters remain fully functional even when mechanically bent to a tensile radius of 4 mm, demonstrating the potential of the technology for flexible electronics. | |
dc.description.sponsorship | The authors would like to acknowledge N. Wijeyasinghe from Imperial College London for her support during the device and circuit fabrication and characterization. | |
dc.publisher | AIP Publishing | |
dc.relation.url | http://aip.scitation.org/doi/10.1063/1.4978531 | |
dc.rights | This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Applied Physics Letters and may be found at http://doi.org/10.1063/1.4978531. | |
dc.title | Solution-processed p-type copper(I) thiocyanate (CuSCN) for low-voltage flexible thin-film transistors and integrated inverter circuits | |
dc.type | Article | |
dc.contributor.department | KAUST Solar Center (KSC) | |
dc.contributor.department | Material Science and Engineering Program | |
dc.contributor.department | Physical Science and Engineering (PSE) Division | |
dc.identifier.journal | Applied Physics Letters | |
dc.eprint.version | Publisher's Version/PDF | |
dc.contributor.institution | Department of Physics and Centre for Plastic Electronics, Blackett Laboratory, Imperial College London, London SW7 2AZ, United Kingdom | |
dc.contributor.institution | Electronics Laboratory, Swiss Federal Institute of Technology Zurich, Gloriastrasse 35, 8092 Zurich, Switzerland | |
dc.contributor.institution | Department of Materials Science and Engineering, School of Molecular Science and Engineering, Vidyasirimedhi Institute of Science and Technology (VISTEC), Rayong 21210, Thailand | |
dc.contributor.institution | Sensor Technology Research Center, School of Engineering and Informatics, University of Sussex, Falmer, Brighton BN1 9RH, United Kingdom | |
dc.contributor.institution | Department of Applied Physics and Materials Research Centre, The Hong Kong Polytechnic University, Hong Kong, China | |
kaust.person | Anthopoulos, Thomas D. | |
refterms.dateFOA | 2018-03-17T00:00:00Z | |
dc.date.published-online | 2017-03-17 | |
dc.date.published-print | 2017-03-13 |
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