Downlink Error Rates of Half-duplex Users in Full-duplex Networks over a Laplacian Inter-User Interference Limited and EGK fading
Type
ArticleKAUST Department
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) DivisionElectrical Engineering Program
KAUST Strategic Research Initiative (SRI) in Uncertainty Quantification
Date
2017-03-14Online Publication Date
2017-03-14Print Publication Date
2017-04Permanent link to this record
http://hdl.handle.net/10754/623034
Metadata
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This paper develops a mathematical framework to study downlink error rates and throughput for half-duplex (HD) terminals served by a full-duplex (FD) base station (BS). The developed model is used to motivate long term pairing for users that have non-line of sight (NLOS) interfering link. Consequently, we study the interferer limited problem that appears between NLOS HD users-pair that are scheduled on the same FD channel. The distribution of the interference is first characterized via its distribution function, which is derived in closed form. Then, a comprehensive performance assessment for the proposed pairing scheme is provided by assuming Extended Generalized- $cal{K}$ (EGK) fading for the downlink and studying different modulation schemes. To this end, a unified closed form expression for the average symbol error rate is derived. Furthermore, we show the effective downlink throughput gain harvested by the pairing NLOS users as a function of the average signal-to-interferenceratio when compared to an idealized HD scenario with neither interference nor noise. Finally, we show the minimum required channel gain pairing threshold to harvest downlink throughput via the FD operation when compared to the HD case for each modulation scheme.Citation
Soury H, ElSawy H, Alouini M-S (2017) Downlink Error Rates of Half-duplex Users in Full-duplex Networks over a Laplacian Inter-User Interference Limited and EGK fading. IEEE Transactions on Wireless Communications: 1–1. Available: http://dx.doi.org/10.1109/TWC.2017.2672548.Additional Links
http://ieeexplore.ieee.org/document/7876869/ae974a485f413a2113503eed53cd6c53
10.1109/TWC.2017.2672548