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dc.contributor.authorVarga,Laszlo
dc.contributor.authorVarga, Bonbien
dc.contributor.authorCalo, Victor M.
dc.date.accessioned2016-11-17T07:44:41Z
dc.date.available2016-11-17T07:44:41Z
dc.date.issued2016-10-20
dc.date.submitted2015-04-16
dc.identifier.urihttp://hdl.handle.net/10754/621826
dc.description.abstractVarious examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.
dc.relation.urlhttp://www.google.com/patents/WO2016166704A1
dc.relation.urlhttp://worldwide.espacenet.com/publicationDetails/biblio?CC=WO&NR=2016166704A1&KC=A1&FT=D
dc.titleX-ray diffraction imaging of material microstructures
dc.typePatent
dc.contributor.departmentPhysical Science and Engineering Division
dc.description.statusPublished Application
dc.contributor.assigneeKing Abdullah University Of Science And Technology
dc.description.countryWorld Intellectual Property Organization (WIPO)
dc.identifier.applicationnumberWO 2016166704 A1
refterms.dateFOA2018-06-13T20:10:35Z


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