Show simple item record

dc.contributor.authorAnjum, Dalaver H.
dc.date.accessioned2016-10-20T11:44:41Z
dc.date.available2016-10-20T11:44:41Z
dc.date.issued2016-08
dc.identifier.citationAnjum DH (2016) Characterization of nanomaterials with transmission electron microscopy. IOP Conference Series: Materials Science and Engineering 146: 012001. Available: http://dx.doi.org/10.1088/1757-899X/146/1/012001.
dc.identifier.issn1757-8981
dc.identifier.issn1757-899X
dc.identifier.doi10.1088/1757-899X/146/1/012001
dc.identifier.urihttp://hdl.handle.net/10754/621085
dc.description.abstractThe field of nanotechnology is about research and development on materials whose at least one dimension is in the range of 1 to 100 nanometers. In recent years, the research activity for developing nano-materials has grown exponentially owing to the fact that they offer better solutions to the challenges faced by various fields such as energy, food, and environment. In this paper, the importance of transmission electron microscopy (TEM) based techniques is demonstrated for investigating the properties of nano-materials. Specifically the nano-materials that are investigated in this report include gold nano-particles (Au-NPs), silver atom-clusters (Ag-ACs), tantalum single-atoms (Ta-SAs), carbon materials functionalized with iron cobalt (Fe-Co) NPs and titania (TiO2) NPs, and platinum loaded Ceria (Pt-CeO2) Nano composite. TEM techniques that are employed to investigate nano-materials include aberration corrected bright-field TEM (BF-TEM), high-angle dark-field scanning TEM (HAADF-STEM), electron energy-loss spectroscopy (EELS), and BF-TEM electron tomography (ET). With the help presented of results in this report, it is proved herein that as many TEM techniques as available in a given instrument are essential for a comprehensive nano-scale analysis of nanomaterials.
dc.description.sponsorshipKAUST is acknowledged for the financial support.
dc.publisherIOP Publishing
dc.relation.urlhttp://stacks.iop.org/1757-899X/146/i=1/a=012001
dc.rightsContent from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/
dc.titleCharacterization of nanomaterials with transmission electron microscopy
dc.typeConference Paper
dc.contributor.departmentImaging and Characterization Core Lab
dc.identifier.journalIOP Conference Series: Materials Science and Engineering
dc.conference.date2015-10-12 to 2015-10-16
dc.conference.name14th International Symposium on Advanced Materials, ISAM 2015
dc.conference.locationIslamabad, PAK
dc.eprint.versionPublisher's Version/PDF
kaust.personAnjum, Dalaver H.
refterms.dateFOA2018-06-13T12:37:25Z


Files in this item

Thumbnail
Name:
10.1088-1757-899X-146-1-012001.pdf
Size:
1.188Mb
Format:
PDF
Description:
Open Access article

This item appears in the following Collection(s)

Show simple item record

Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Except where otherwise noted, this item's license is described as Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.