Characterization of nanomaterials with transmission electron microscopy
AuthorsAnjum, Dalaver H.
Permanent link to this recordhttp://hdl.handle.net/10754/621085
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AbstractThe field of nanotechnology is about research and development on materials whose at least one dimension is in the range of 1 to 100 nanometers. In recent years, the research activity for developing nano-materials has grown exponentially owing to the fact that they offer better solutions to the challenges faced by various fields such as energy, food, and environment. In this paper, the importance of transmission electron microscopy (TEM) based techniques is demonstrated for investigating the properties of nano-materials. Specifically the nano-materials that are investigated in this report include gold nano-particles (Au-NPs), silver atom-clusters (Ag-ACs), tantalum single-atoms (Ta-SAs), carbon materials functionalized with iron cobalt (Fe-Co) NPs and titania (TiO2) NPs, and platinum loaded Ceria (Pt-CeO2) Nano composite. TEM techniques that are employed to investigate nano-materials include aberration corrected bright-field TEM (BF-TEM), high-angle dark-field scanning TEM (HAADF-STEM), electron energy-loss spectroscopy (EELS), and BF-TEM electron tomography (ET). With the help presented of results in this report, it is proved herein that as many TEM techniques as available in a given instrument are essential for a comprehensive nano-scale analysis of nanomaterials.
CitationAnjum DH (2016) Characterization of nanomaterials with transmission electron microscopy. IOP Conference Series: Materials Science and Engineering 146: 012001. Available: http://dx.doi.org/10.1088/1757-899X/146/1/012001.
SponsorsKAUST is acknowledged for the financial support.
Conference/Event name14th International Symposium on Advanced Materials, ISAM 2015
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