Electrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistance
Type
ArticleAuthors
Selzer, FranzFloresca, Carlo
Kneppe, David
Bormann, Ludwig
Sachse, Christoph
Weiß, Nelli
Eychmüller, Alexander
Amassian, Aram

Müller-Meskamp, Lars
Leo, Karl
KAUST Department
KAUST Solar Center (KSC)Material Science and Engineering Program
Organic Electronics and Photovoltaics Group
Physical Science and Engineering (PSE) Division
Date
2016-04-19Online Publication Date
2016-04-19Print Publication Date
2016-04-18Permanent link to this record
http://hdl.handle.net/10754/606961
Metadata
Show full item recordAbstract
We measure basic network parameters of silvernanowire (AgNW) networks commonly used as transparent conductingelectrodes in organic optoelectronic devices. By means of four point probing with nanoprobes, the wire-to-wire junction resistance and the resistance of single nanowires are measured. The resistanceRNW of a single nanowire shows a value of RNW=(4.96±0.18) Ω/μm. The junction resistanceRJ differs for annealed and non-annealed NW networks, exhibiting values of RJ=(25.2±1.9) Ω (annealed) and RJ=(529±239) Ω (non-annealed), respectively. Our simulation achieves a good agreement between the measured network parameters and the sheet resistanceRS of the entire network. Extrapolating RJ to zero, our study show that we are close to the electrical limit of the conductivity of our AgNW system: We obtain a possible RS reduction by only ≈20% (common RS≈10 Ω/sq). Therefore, we expect further performance improvements in AgNW systems mainly by increasing NW length or by utilizing novel network geometries.Citation
Electrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistance 2016, 108 (16):163302 Applied Physics LettersSponsors
This work was funded by the European Community’s Seventh Framework Program (FP7/2007-2013) under Grant Agreement No. 314068 and within the DFG Cluster of Excellence “Center for Advancing Electronics Dresden.”Publisher
AIP PublishingJournal
Applied Physics Lettersae974a485f413a2113503eed53cd6c53
10.1063/1.4947285