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dc.contributor.authorNaydenov, Borislav
dc.contributor.authorMantega, Mauro
dc.contributor.authorRungger, Ivan
dc.contributor.authorSanvito, Stefano
dc.contributor.authorBoland, John J.
dc.date.accessioned2016-02-28T05:53:26Z
dc.date.available2016-02-28T05:53:26Z
dc.date.issued2011-11-28
dc.identifier.citationNaydenov B, Mantega M, Rungger I, Sanvito S, Boland JJ (2011) Scattered surface charge density: A tool for surface characterization. Physical Review B 84. Available: http://dx.doi.org/10.1103/PhysRevB.84.195321.
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.doi10.1103/PhysRevB.84.195321
dc.identifier.urihttp://hdl.handle.net/10754/599563
dc.description.abstractWe demonstrate the use of nonlocal scanning tunneling spectroscopic measurements to characterize the local structure of adspecies in their states where they are significantly less perturbed by the probe, which is accomplished by mapping the amplitude and phase of the scattered surface charge density. As an example, we study single-H-atom adsorption on the n-type Si(100)-(4 × 2) surface, and demonstrate the existence of two different configurations that are distinguishable using the nonlocal approach and successfully corroborated by density functional theory. © 2011 American Physical Society.
dc.description.sponsorshipJ.J.B. and S. S. acknowledge the Science Foundation Ireland funded Principal Investigator Awards (Grant No. 06/IN.1/I106, Grant No. 07/IN.1/I945) and CRANN. I. R. acknowledges funding from KAUST. Computational resources have been provided by the HEA IITAC project managed by the Trinity Center for High Performance Computing and by ICHEC.
dc.publisherAmerican Physical Society (APS)
dc.titleScattered surface charge density: A tool for surface characterization
dc.typeArticle
dc.identifier.journalPhysical Review B
dc.contributor.institutionTrinity College Dublin, Dublin, Ireland


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