Scattered surface charge density: A tool for surface characterization
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AbstractWe demonstrate the use of nonlocal scanning tunneling spectroscopic measurements to characterize the local structure of adspecies in their states where they are significantly less perturbed by the probe, which is accomplished by mapping the amplitude and phase of the scattered surface charge density. As an example, we study single-H-atom adsorption on the n-type Si(100)-(4 × 2) surface, and demonstrate the existence of two different configurations that are distinguishable using the nonlocal approach and successfully corroborated by density functional theory. © 2011 American Physical Society.
CitationNaydenov B, Mantega M, Rungger I, Sanvito S, Boland JJ (2011) Scattered surface charge density: A tool for surface characterization. Physical Review B 84. Available: http://dx.doi.org/10.1103/PhysRevB.84.195321.
SponsorsJ.J.B. and S. S. acknowledge the Science Foundation Ireland funded Principal Investigator Awards (Grant No. 06/IN.1/I106, Grant No. 07/IN.1/I945) and CRANN. I. R. acknowledges funding from KAUST. Computational resources have been provided by the HEA IITAC project managed by the Trinity Center for High Performance Computing and by ICHEC.
PublisherAmerican Physical Society (APS)
JournalPhysical Review B