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dc.contributor.authorHayes, Keesha A.
dc.contributor.authorBuckley, Mark R.
dc.contributor.authorCohen, Itai
dc.contributor.authorArcher, Lynden A.
dc.date.accessioned2016-02-25T13:30:44Z
dc.date.available2016-02-25T13:30:44Z
dc.date.issued2008-11-17
dc.identifier.citationHayes KA, Buckley MR, Cohen I, Archer LA (2008) High Resolution Shear Profile Measurements in Entangled Polymers. Physical Review Letters 101. Available: http://dx.doi.org/10.1103/PhysRevLett.101.218301.
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.pmid19113455
dc.identifier.doi10.1103/PhysRevLett.101.218301
dc.identifier.urihttp://hdl.handle.net/10754/598480
dc.description.abstractWe use confocal microscopy and particle image velocimetry to visualize motion of 250-300 nm. fluorescent tracer particles in entangled polymers subject to a rectilinear shear flow. Our results show linear velocity profiles in polymer solutions spanning a wide range of molecular weights and number of entanglements (8≤Z≤56), but reveal large differences between the imposed and measured shear rates. These findings disagree with recent reports that shear banding is a characteristic flow response of entangled polymers, and instead point to interfacial slip as an important source of strain loss. © 2008 The American Physical Society.
dc.description.sponsorshipThis study was supported by the National Science Foundation (DMR0551185 and DMR0606040) and by KAUST-CU Center for Energy and Sustainability. We are grateful to Erik Herz and Ulrich Wiesner for providing fluorescent nanoparticle tracers used in the study.
dc.publisherAmerican Physical Society (APS)
dc.titleHigh Resolution Shear Profile Measurements in Entangled Polymers
dc.typeArticle
dc.identifier.journalPhysical Review Letters
dc.contributor.institutionCornell University, Ithaca, United States


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