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dc.contributor.authorLai, Keji
dc.contributor.authorKundhikanjana, Worasom
dc.contributor.authorKelly, Michael A.
dc.contributor.authorShen, Zhi-Xun
dc.date.accessioned2016-02-23T13:52:17Z
dc.date.available2016-02-23T13:52:17Z
dc.date.issued2011-04-21
dc.identifier.citationLai K, Kundhikanjana W, Kelly MA, Shen Z-X (2011) Nanoscale microwave microscopy using shielded cantilever probes. Applied Nanoscience 1: 13–18. Available: http://dx.doi.org/10.1007/s13204-011-0002-7.
dc.identifier.issn2190-5509
dc.identifier.issn2190-5517
dc.identifier.doi10.1007/s13204-011-0002-7
dc.identifier.urihttp://hdl.handle.net/10754/597004
dc.description.abstractQuantitative dielectric and conductivity mapping in the nanoscale is highly desirable for many research disciplines, but difficult to achieve through conventional transport or established microscopy techniques. Taking advantage of the micro-fabrication technology, we have developed cantilever-based near-field microwave probes with shielded structures. Sensitive microwave electronics and finite-element analysis modeling are also utilized for quantitative electrical imaging. The system is fully compatible with atomic force microscope platforms for convenient operation and easy integration of other modes and functions. The microscope is ideal for interdisciplinary research, with demonstrated examples in nano electronics, physics, material science, and biology.
dc.description.sponsorshipThis work is supported by Award No. KUS-F1-033-02, made by King Abdullah University of Science and Technology (KAUST) under the global research partnership (GRP) program. Additional supports are from Center of Probing the Nanoscale (CPN), Stanford University, a gift grant of Agilent Technologies, Inc., NSF Grant DMR-0906027, and DOE under Contract Nos. DE-FG03-01ER45929-A001 and DE-FG36-08GOI8004. CPN is an NSF NSEC, NSF Grant No. PHY-0425897.
dc.publisherSpringer Nature
dc.rightsThis article is distributed under the terms of the Creative Commons Attribution License which permits any use, distribution, and reproduction in any medium, provided the original author(s) and source are credited.
dc.titleNanoscale microwave microscopy using shielded cantilever probes
dc.typeArticle
dc.identifier.journalApplied Nanoscience
dc.contributor.institutionDepartment of Physics and Applied Physics, Geballe Laboratory for Advanced Materials, Stanford University, Stanford, CA 94305, USA
kaust.grant.numberKUS-F1-033-02
refterms.dateFOA2018-06-13T12:08:29Z
dc.date.published-online2011-04-21
dc.date.published-print2011-05


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